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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 19, Iss. 24 — Nov. 21, 2011
  • pp: 24782–24782

Improved sample characterization in terahertz reflection imaging and spectroscopy: erratum

Shengyang Huang, Philip C. Ashworth, Kanis Wai Chi Kan, Yang Chen, Vincent P. Wallace, Yuan-ting Zhang, and Emma Pickwell-MacPherson  »View Author Affiliations


Optics Express, Vol. 19, Issue 24, pp. 24782-24782 (2011)
http://dx.doi.org/10.1364/OE.19.024782


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Abstract

The project codes of the grants supporting our research were omitted in the acknowledgment section of the paper. Here the project codes are given alongside the funding bodies.

© 2011 OSA

OCIS Codes
(120.5700) Instrumentation, measurement, and metrology : Reflection
(300.6495) Spectroscopy : Spectroscopy, teraherz
(110.6795) Imaging systems : Terahertz imaging

ToC Category:
Spectroscopy

History
Original Manuscript: November 14, 2011
Published: November 17, 2011

Citation
Shengyang Huang, Philip C. Ashworth, Kanis Wai Chi Kan, Yang Chen, Vincent P. Wallace, Yuan-ting Zhang, and Emma Pickwell-MacPherson, "Improved sample characterization in terahertz reflection imaging and spectroscopy: erratum," Opt. Express 19, 24782-24782 (2011)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-19-24-24782


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