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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 19, Iss. 25 — Dec. 5, 2011
  • pp: 24905–24921

A chip-scale integrated cavity-electro-optomechanics platform

M. Winger, T. D. Blasius, T. P. Mayer Alegre, A. H. Safavi-Naeini, S. Meenehan, J. Cohen, S. Stobbe, and O. Painter  »View Author Affiliations


Optics Express, Vol. 19, Issue 25, pp. 24905-24921 (2011)
http://dx.doi.org/10.1364/OE.19.024905


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Abstract

We present an integrated optomechanical and electromechanical nanocavity, in which a common mechanical degree of freedom is coupled to an ultrahigh-Q photonic crystal defect cavity and an electrical circuit. The system allows for wide-range, fast electrical tuning of the optical nanocavity resonances, and for electrical control of optical radiation pressure back-action effects such as mechanical amplification (phonon lasing), cooling, and stiffening. These sort of integrated devices offer a new means to efficiently interconvert weak microwave and optical signals, and are expected to pave the way for a new class of micro-sensors utilizing optomechanical back-action for thermal noise reduction and low-noise optical read-out.

© 2011 OSA

OCIS Codes
(220.4880) Optical design and fabrication : Optomechanics
(230.3120) Optical devices : Integrated optics devices
(230.4110) Optical devices : Modulators
(350.2460) Other areas of optics : Filters, interference
(350.4238) Other areas of optics : Nanophotonics and photonic crystals
(230.4685) Optical devices : Optical microelectromechanical devices
(280.4788) Remote sensing and sensors : Optical sensing and sensors
(230.5298) Optical devices : Photonic crystals

ToC Category:
Integrated Optics

History
Original Manuscript: September 23, 2011
Revised Manuscript: November 17, 2011
Manuscript Accepted: November 18, 2011
Published: November 22, 2011

Citation
M. Winger, T. D. Blasius, T. P. Mayer Alegre, A. H. Safavi-Naeini, S. Meenehan, J. Cohen, S. Stobbe, and O. Painter, "A chip-scale integrated cavity-electro-optomechanics platform," Opt. Express 19, 24905-24921 (2011)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-19-25-24905


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