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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 19, Iss. 25 — Dec. 5, 2011
  • pp: 24980–24985

Characterizing and modeling backscattering in silicon microring resonators

G. C. Ballesteros, J. Matres, J. Martí, and C. J. Oton  »View Author Affiliations


Optics Express, Vol. 19, Issue 25, pp. 24980-24985 (2011)
http://dx.doi.org/10.1364/OE.19.024980


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Abstract

We present an experimental technique to characterize backscattering in silicon microring resonators, together with a simple analytical model that reproduces the experimental results. The model can extract all the key parameters of an add-drop-type resonator, which are the loss, both coupling coefficients and backscattering. We show that the backscattering effect strongly affects the resonance shape, and that consecutive resonances of the same ring can have very different backscattering parameters.

© 2011 OSA

OCIS Codes
(220.0220) Optical design and fabrication : Optical design and fabrication
(230.3990) Optical devices : Micro-optical devices
(230.5750) Optical devices : Resonators
(250.5300) Optoelectronics : Photonic integrated circuits

ToC Category:
Integrated Optics

Citation
G. C. Ballesteros, J. Matres, J. Martí, and C. J. Oton, "Characterizing and modeling backscattering in silicon microring resonators," Opt. Express 19, 24980-24985 (2011)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-19-25-24980


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