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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 19, Iss. 25 — Dec. 5, 2011
  • pp: 25729–25740

Dielectric particle and void resonators for thin film solar cell textures

Sander A. Mann, Richard R. Grote, Richard M. Osgood, Jr., and Jon A. Schuller  »View Author Affiliations

Optics Express, Vol. 19, Issue 25, pp. 25729-25740 (2011)

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Abstract: Using Mie theory and Rigorous Coupled Wave Analysis (RCWA) we compare the properties of dielectric particle and void resonators. We show that void resonators—low refractive index inclusions within a high index embedding medium—exhibit larger bandwidth resonances, reduced peak scattering intensity, different polarization anisotropies, and enhanced forward scattering when compared to their particle (high index inclusions in a low index medium) counterparts. We evaluate amorphous silicon solar cell textures comprising either arrays of voids or particles. Both designs support substantial absorption enhancements (up to 45%) relative to a flat cell with anti-reflection coating, over a large range of cell thicknesses. By leveraging void-based textures 90% of above-bandgap photons are absorbed in cells with maximal vertical dimension of 100 nm.

© 2011 OSA

OCIS Codes
(050.1950) Diffraction and gratings : Diffraction gratings
(140.4780) Lasers and laser optics : Optical resonators
(290.4020) Scattering : Mie theory
(350.6050) Other areas of optics : Solar energy
(050.6624) Diffraction and gratings : Subwavelength structures
(310.6845) Thin films : Thin film devices and applications

ToC Category:
Solar Energy

Original Manuscript: September 30, 2011
Revised Manuscript: November 17, 2011
Manuscript Accepted: November 17, 2011
Published: December 1, 2011

Sander A. Mann, Richard R. Grote, Richard M. Osgood, and Jon A. Schuller, "Dielectric particle and void resonators for thin film solar cell textures," Opt. Express 19, 25729-25740 (2011)

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