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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 19, Iss. 25 — Dec. 5, 2011
  • pp: 25749–25762

Surface plasmon leakage radiation microscopy at the diffraction limit

A. Hohenau, J. R. Krenn, A. Drezet, O. Mollet, S. Huant, C. Genet, B. Stein, and T. W. Ebbesen  »View Author Affiliations

Optics Express, Vol. 19, Issue 25, pp. 25749-25762 (2011)

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This paper describes the image formation process in optical leakage radiation microscopy of surface plasmon-polaritons with diffraction limited spatial resolution. The comparison of experimentally recorded images with simulations of point-like surface plasmon-polariton emitters allows for an assignment of the observed fringe patterns. A simple formula for the prediction of the fringe periodicity is presented and practically relevant effects of abberations in the imaging system are discussed.

© 2011 OSA

OCIS Codes
(180.0180) Microscopy : Microscopy
(240.6680) Optics at surfaces : Surface plasmons

ToC Category:
Optics at Surfaces

Original Manuscript: October 11, 2011
Revised Manuscript: October 28, 2011
Manuscript Accepted: October 28, 2011
Published: December 1, 2011

Virtual Issues
Vol. 7, Iss. 2 Virtual Journal for Biomedical Optics

A. Hohenau, J. R. Krenn, A. Drezet, O. Mollet, S. Huant, C. Genet, B. Stein, and T. W. Ebbesen, "Surface plasmon leakage radiation microscopy at the diffraction limit," Opt. Express 19, 25749-25762 (2011)

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