OSA's Digital Library

Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 19, Iss. 27 — Dec. 19, 2011
  • pp: 26684–26695

Remotely measuring a thin dielectric coating on a metallic cylinder

Nicholas George and Paul Zavattero  »View Author Affiliations

Optics Express, Vol. 19, Issue 27, pp. 26684-26695 (2011)

View Full Text Article

Enhanced HTML    Acrobat PDF (801 KB)

Browse Journals / Lookup Meetings

Browse by Journal and Year


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools



A laser optical metrology system is described that remotely measures at high rate the presence and thickness of a thin-film lubricant on metallic cylinders with diameters on the order of 0.5 mm. Applications include remote measurement of hypodermic needle dielectric coating thickness in a clean room environment. High accuracy computer simulation of the electric field scattered from a coated cylinder by an incident laser beam is demonstrated using the condition numbers of the matrices defined by the boundary value matching equations derived from the eigenfunction expansion of the exact solution to Maxwell’s equations. Dielectric coatings from 1 μm to 50 μm are seen to be readily observed and accurately measured using a remotely placed CMOS array. Distinctive signatures are shown for film thicknesses in the range from 0 to 10 μm , and an appropriate location for CMOS detector placement is determined from the scattering patterns.

© 2011 OSA

OCIS Codes
(070.5010) Fourier optics and signal processing : Pattern recognition
(120.4630) Instrumentation, measurement, and metrology : Optical inspection
(240.0310) Optics at surfaces : Thin films
(260.1960) Physical optics : Diffraction theory
(260.2110) Physical optics : Electromagnetic optics
(290.5820) Scattering : Scattering measurements
(050.1755) Diffraction and gratings : Computational electromagnetic methods
(290.5825) Scattering : Scattering theory

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: September 15, 2011
Revised Manuscript: October 26, 2011
Manuscript Accepted: November 25, 2011
Published: December 14, 2011

Nicholas George and Paul Zavattero, "Remotely measuring a thin dielectric coating on a metallic cylinder," Opt. Express 19, 26684-26695 (2011)

Sort:  Journal  |  Reset  


  1. C. A. Balanis, Advanced Engineering Electromagnetics (J. Wiley & Sons, 1989).
  2. J. A. Kong, Electromagnetic Wave Theory (EMW Publishing, 2008).
  3. J. J. Bowmann, T. B. A. Senior, and P. L. E. Uslenghi, Electromagnetic and Acoustic Scattering by Simple Shapes (North Holland, 1969).
  4. M. Kerker, The Scattering of Light and Other Electromagnetic Radiation (Academic, 1969).
  5. Handbook of Ellipsometry, H.G. Tompkins and E.A. Irene, Eds. (William Andrew, 2005).
  6. G. James, Geometrical Theory of Diffraction for Electromagnetic Waves (Peregrinus, 2003).
  7. V. Borovikov and B. Kinber, Geometrical Theory of Diffraction (Institute of Electrical Engineers, 1994).
  8. G. Strang, Linear Algebra and its Applications (Thompson Brooks/Cole, 2006).

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited