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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 19, Iss. 3 — Jan. 31, 2011
  • pp: 2608–2618

Directional edge enhancement in optical tomography of thin phase objects

Cruz Meneses-Fabian, Areli Montes-Perez, and Gustavo Rodriguez-Zurita  »View Author Affiliations


Optics Express, Vol. 19, Issue 3, pp. 2608-2618 (2011)
http://dx.doi.org/10.1364/OE.19.002608


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Abstract

In this paper, we make a proposal to obtain the Hilbert-transform for each entry of the projection data leaving the slice of a thin phase object. These modified projections are stacked in such a way that they form a modified sinogram called Hilbert-sinogram. We prove that the inverse Radon-transform of this sinogram is the directional Hilbert-transform of the slice function, and the reconstructed image is the directional edge enhancement of the distribution function on the slice. The Hilbert-transform is implemented by a 4f optical Fourier-transform correlator and a spatial filter consisting of a phase step of π radians. One important feature of this proposal is to perform a turn of 180° in the spatial filter at a certain value of the projection angle within the range [ 0 ° ,   360 ° ] . The desired direction of enhancement can be chosen by the proper selection of such turning angle. We present both the mathematical modeling and numerical results.

© 2011 OSA

OCIS Codes
(070.6110) Fourier optics and signal processing : Spatial filtering
(100.1160) Image processing : Analog optical image processing
(170.6960) Medical optics and biotechnology : Tomography
(200.4740) Optics in computing : Optical processing
(110.6955) Imaging systems : Tomographic imaging

ToC Category:
Fourier Optics and Signal Processing

History
Original Manuscript: November 2, 2010
Revised Manuscript: December 24, 2010
Manuscript Accepted: December 27, 2010
Published: January 27, 2011

Virtual Issues
Vol. 6, Iss. 2 Virtual Journal for Biomedical Optics

Citation
Cruz Meneses-Fabian, Areli Montes-Perez, and Gustavo Rodriguez-Zurita, "Directional edge enhancement in optical tomography of thin phase objects," Opt. Express 19, 2608-2618 (2011)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-19-3-2608


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