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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 19, Iss. 4 — Feb. 14, 2011
  • pp: 2866–2873

Phasing of coherent femtosecond X-ray diffraction from size-varying nanocrystals

John C. H. Spence, Richard A. Kirian, Xiaoyu Wang, Uwe Weierstall, Kevin E. Schmidt, Thomas White, Anton Barty, Henry N. Chapman, Stefano Marchesini, and James Holton  »View Author Affiliations


Optics Express, Vol. 19, Issue 4, pp. 2866-2873 (2011)
http://dx.doi.org/10.1364/OE.19.002866


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Abstract

The scattering between Bragg reflections from nanocrystals is used to aid solution of the phase problem. We describe a method for reconstructing the charge density of a typical molecule within a single unit cell, if sufficiently finely-sampled “snap-shot” diffraction data (as provided a free-electron X-ray laser) are available from many nanocrystals of different sizes lying in random orientations. By using information on the particle-size distribution within the patterns, this digital method succeeds, using all the data, without knowledge of the distribution of particle size or requiring atomic-resolution data.

© 2011 OSA

OCIS Codes
(100.5070) Image processing : Phase retrieval
(260.1960) Physical optics : Diffraction theory
(290.5840) Scattering : Scattering, molecules
(320.7100) Ultrafast optics : Ultrafast measurements

ToC Category:
Image Processing

History
Original Manuscript: December 15, 2010
Revised Manuscript: January 26, 2011
Manuscript Accepted: January 27, 2011
Published: January 31, 2011

Citation
John C. H. Spence, Richard A. Kirian, Xiaoyu Wang, Uwe Weierstall, Kevin E. Schmidt, Thomas White, Anton Barty, Henry N. Chapman, Stefano Marchesini, and James Holton, "Phasing of coherent femtosecond X-ray diffraction from size-varying nanocrystals," Opt. Express 19, 2866-2873 (2011)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-19-4-2866


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