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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 19, Iss. 5 — Feb. 28, 2011
  • pp: 4464–4471

Real-time pulse length measurement of few-cycle laser pulses using above-threshold ionization

A. M. Sayler, Tim Rathje, W. Müller, Ch. Kürbis, Klaus Rühle, Gero Stibenz, and G. G. Paulus  »View Author Affiliations


Optics Express, Vol. 19, Issue 5, pp. 4464-4471 (2011)
http://dx.doi.org/10.1364/OE.19.004464


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Abstract

The pulse lengths of intense few-cycle (4 – 10 fs) laser pulses at 790 nm are determined in real-time using a stereographic above-threshold ionization (ATI) measurement of Xe, i.e. the same apparatus recently shown to provide a precise, real-time, every-single-shot, carrier-envelope phase measurement of ultrashort laser pulses. The pulse length is calibrated using spectral-phase interferometry for direct electric-field reconstruction (SPIDER) and roughly agrees with calculations done using quantitative rescattering theory (QRS). This stereo-ATI technique provides the information necessary to characterize the waveform of every pulse in a kHz pulse train, within the Gaussian pulse approximation, and relies upon no theoretical assumptions. Moreover, the real-time display is a highly effective tool for tuning and monitoring ultrashort pulse characteristics.

© 2011 Optical Society of America

OCIS Codes
(020.4180) Atomic and molecular physics : Multiphoton processes
(320.2250) Ultrafast optics : Femtosecond phenomena
(320.7100) Ultrafast optics : Ultrafast measurements
(320.7160) Ultrafast optics : Ultrafast technology
(020.2649) Atomic and molecular physics : Strong field laser physics

ToC Category:
Ultrafast Optics

History
Original Manuscript: December 16, 2010
Revised Manuscript: January 29, 2011
Manuscript Accepted: January 31, 2011
Published: February 23, 2011

Citation
A. M. Sayler, Tim Rathje, W. Müller, Ch. Kürbis, Klaus Rühle, Gero Stibenz, and G. G. Paulus, "Real-time pulse length measurement of few-cycle laser pulses using above-threshold ionization," Opt. Express 19, 4464-4471 (2011)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-19-5-4464


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