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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 19, Iss. 6 — Mar. 14, 2011
  • pp: 5327–5338

Comprehensive modeling of THz microscope with a sub-wavelength source

Hungyen Lin, Christophe Fumeaux, Benjamin Seam Yu Ung, and Derek Abbott  »View Author Affiliations


Optics Express, Vol. 19, Issue 6, pp. 5327-5338 (2011)
http://dx.doi.org/10.1364/OE.19.005327


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Abstract

The sub-wavelength THz emission point on a nonlinear electro-optical crystal, used in broadband THz near-field emission microscopy, is computationally modeled as a radiating aperture of Gaussian intensity profile. This paper comprehensively studies the Gaussian aperture model in the THz near-field regime and validates the findings with dual-axis knife-edge experiments. Based on realistic parameter values, the model allows for THz beam characterisation in the near-field region for potential microscopy applications. An application example is demonstrated by scanning over a cyclic-olefin copolymer sample containing grooves placed sub-wavelengths apart. The nature of THz microscopy in the near-field is highly complex and traditionally based on experiments. The proposed validated numerical model therefore aids in the quantitative understanding of the performance parameters. Whilst in this paper we demonstrate the model on broadband electro-optical THz near-field emission microscopy, the model may apply without a loss of generality to other types of THz near-field focused beam techniques.

© 2011 Optical Society of America

OCIS Codes
(300.6495) Spectroscopy : Spectroscopy, teraherz
(110.6795) Imaging systems : Terahertz imaging

ToC Category:
Microscopy

History
Original Manuscript: November 19, 2010
Revised Manuscript: January 5, 2011
Manuscript Accepted: February 9, 2011
Published: March 7, 2011

Virtual Issues
Vol. 6, Iss. 4 Virtual Journal for Biomedical Optics

Citation
Hungyen Lin, Christophe Fumeaux, Benjamin Seam Yu Ung, and Derek Abbott, "Comprehensive modeling of THz microscope with a sub-wavelength source," Opt. Express 19, 5327-5338 (2011)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-19-6-5327


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