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Optics Express

Optics Express

  • Editor: C. Martijin de Sterke
  • Vol. 19, Iss. 7 — Mar. 28, 2011
  • pp: 5725–5734

Time-resolved interferometry of femtosecond-laser-induced processes under tight focusing and close-to-optical breakdown inside borosilicate glass

Yoshio Hayasaki, Mitsuhiro Isaka, Akihiro Takita, and Saulius Juodkazis  »View Author Affiliations

Optics Express, Vol. 19, Issue 7, pp. 5725-5734 (2011)

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We use an interferometric time-resolved observation of a femtosecond-laser pulse (800nm/45fs) interaction with glass from 100 fs to 10 ns at spatial lateral resolution down to the wavelength of the pulse. The phase and amplitude images reveal sequence of events after the irradiation of a single ultra-short laser pulse at close-to-threshold intensity when permanent refractive index changes occur. The proposed method is applicable to characterization of the processes induced by tightly focused fs-laser pulses during three-dimensional structuring of glasses and crystals for fundamental studies and optical applications. Generation of carriers, thermal expansion, generation and propagation of shockwaves, and formation of refractive index changes are experimentally observed and resolved in time and space with the highest resolution. Quantitative estimations of the threshold energies of different processes are achieved. The threshold energy of carrier generation is found the same as that of shockwave generation while the threshold energy of refractive index changes was by 40% higher. Application potential of the method is discussed.

© 2011 OSA

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(320.7120) Ultrafast optics : Ultrafast phenomena
(220.4241) Optical design and fabrication : Nanostructure fabrication

ToC Category:
Laser Microfabrication

Original Manuscript: December 20, 2010
Revised Manuscript: February 14, 2011
Manuscript Accepted: February 28, 2011
Published: March 14, 2011

Yoshio Hayasaki, Mitsuhiro Isaka, Akihiro Takita, and Saulius Juodkazis, "Time-resolved interferometry of femtosecond-laser-induced processes under tight focusing and close-to-optical breakdown inside borosilicate glass," Opt. Express 19, 5725-5734 (2011)

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