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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 19, Iss. 9 — Apr. 25, 2011
  • pp: 8073–8078

Experimental characterization of the coherence properties of hard x-ray sources

Daniele Pelliccia, Andrei Y. Nikulin, Herbert O. Moser, and Keith A. Nugent  »View Author Affiliations

Optics Express, Vol. 19, Issue 9, pp. 8073-8078 (2011)

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The experimental characterization of the coherence properties of hard X-ray sources is reported and discussed. The source is described by its Mutual Optical Intensity (MOI). The coherent-mode decomposition is applied to the MOI described by a Gaussian-Schell model. The method allows for a direct, quantitative characterization of the degree of coherence of both synchrotron and laboratory sources. The latter represents the first example of characterizing a low coherence hard x-ray source.

© 2011 OSA

OCIS Codes
(030.1640) Coherence and statistical optics : Coherence
(030.6600) Coherence and statistical optics : Statistical optics
(340.6720) X-ray optics : Synchrotron radiation

ToC Category:
X-ray Optics

Original Manuscript: February 23, 2011
Revised Manuscript: April 7, 2011
Manuscript Accepted: April 9, 2011
Published: April 12, 2011

Daniele Pelliccia, Andrei Y. Nikulin, Herbert O. Moser, and Keith A. Nugent, "Experimental characterization of the coherence properties of hard x-ray sources," Opt. Express 19, 8073-8078 (2011)

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