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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 19, Iss. 9 — Apr. 25, 2011
  • pp: 8471–8485

Absorption imaging of ultracold atoms on atom chips

David A. Smith, Simon Aigner, Sebastian Hofferberth, Michael Gring, Mauritz Andersson, Stefan Wildermuth, Peter Krüger, Stephan Schneider, Thorsten Schumm, and Jörg Schmiedmayer  »View Author Affiliations

Optics Express, Vol. 19, Issue 9, pp. 8471-8485 (2011)

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Imaging ultracold atomic gases close to surfaces is an important tool for the detailed analysis of experiments carried out using atom chips. We describe the critical factors that need be considered, especially when the imaging beam is purposely reflected from the surface. In particular we present methods to measure the atom-surface distance, which is a prerequisite for magnetic field imaging and studies of atom surface-interactions.

© 2011 OSA

OCIS Codes
(020.0020) Atomic and molecular physics : Atomic and molecular physics
(110.0110) Imaging systems : Imaging systems

ToC Category:
Atomic and Molecular Physics

Original Manuscript: January 24, 2011
Revised Manuscript: March 23, 2011
Manuscript Accepted: March 30, 2011
Published: April 18, 2011

David A. Smith, Simon Aigner, Sebastian Hofferberth, Michael Gring, Mauritz Andersson, Stefan Wildermuth, Peter Krüger, Stephan Schneider, Thorsten Schumm, and Jörg Schmiedmayer, "Absorption imaging of ultracold atoms on atom chips," Opt. Express 19, 8471-8485 (2011)

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