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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 19, Iss. 9 — Apr. 25, 2011
  • pp: 8781–8794

Improved arrayed-waveguide-grating layout avoiding systematic phase errors

Nur Ismail, Fei Sun, Gabriel Sengo, Kerstin Wörhoff, Alfred Driessen, René M. de Ridder, and Markus Pollnau  »View Author Affiliations

Optics Express, Vol. 19, Issue 9, pp. 8781-8794 (2011)

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We present a detailed description of an improved arrayed-waveguide-grating (AWG) layout for both, low and high diffraction orders. The novel layout presents identical bends across the entire array; in this way systematic phase errors arising from different bends that are inherent to conventional AWG designs are completely eliminated. In addition, for high-order AWGs our design results in more than 50% reduction of the occupied area on the wafer. We present an experimental characterization of a low-order device fabricated according to this geometry. The device has a resolution of 5.5 nm, low intrinsic losses (< 2 dB) in the wavelength region of interest for the application, and is polarization insensitive over a wide spectral range of 215 nm.

© 2011 OSA

OCIS Codes
(300.6190) Spectroscopy : Spectrometers
(130.7408) Integrated optics : Wavelength filtering devices

ToC Category:
Integrated Optics

Original Manuscript: February 18, 2011
Revised Manuscript: April 15, 2011
Manuscript Accepted: April 17, 2011
Published: April 20, 2011

Nur Ismail, Fei Sun, Gabriel Sengo, Kerstin Wörhoff, Alfred Driessen, René M. de Ridder, and Markus Pollnau, "Improved arrayed-waveguide-grating layout avoiding systematic phase errors," Opt. Express 19, 8781-8794 (2011)

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