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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 19, Iss. 9 — Apr. 25, 2011
  • pp: 8903–8911

Optical cavity characterization in nanowires via self-generated broad-band emission

Adam M. Schwartzberg, Shaul Aloni, Tevye Kuykendall, P. James Schuck, and Jeffrey J. Urban  »View Author Affiliations

Optics Express, Vol. 19, Issue 9, pp. 8903-8911 (2011)

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Broadband white light is of great spectroscopic value and would be a powerful tool for nanoscale spectroscopy, however, generation and direction of white light on this length scale remains challenging. Here, we demonstrate the generation of broadband white light in sub-wavelength diameter Gallium Nitride (GaN) wires by coincident one- and two-photon absorption mediated via defect states. This generation of broadband, “white” light enables single-nanowire interferometric measurements of the nanowires themselves via analysis of the Fabry-Pérot fringes that overlay the entirety of the emission spectrum. The quality factor and finesse of individual nanowire cavities were measured and calculated to be 186 ± 88 and 3.05 ±0.6 respectively, averaged over 20 individual wires. This work presents a new, simple approach for the generation and direction of broad band white light at sub-diffraction limit length scales, ideal for translating classical white light spectroscopies to higher spatial resolutions then previously achieved.

© 2011 OSA

OCIS Codes
(180.5810) Microscopy : Scanning microscopy
(190.3970) Nonlinear optics : Microparticle nonlinear optics

ToC Category:

Original Manuscript: February 25, 2011
Revised Manuscript: March 28, 2011
Manuscript Accepted: April 1, 2011
Published: April 22, 2011

Adam M. Schwartzberg, Shaul Aloni, Tevye Kuykendall, P. James Schuck, and Jeffrey J. Urban, "Optical cavity characterization in nanowires via self-generated broad-band emission," Opt. Express 19, 8903-8911 (2011)

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