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Optics Express

Optics Express

  • Editor: J. H. Eberly
  • Vol. 2, Iss. 13 — Jun. 22, 1998
  • pp: 515–515

Focus Issue: Optical Methods for Material Inspection

M. D. Duncan and M. Bashkansky  »View Author Affiliations


Optics Express, Vol. 2, Issue 13, pp. 515-515 (1998)
http://dx.doi.org/10.1364/OE.2.000515


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Abstract

Finding defects in materials using optics has a long and glorious history. The very first optical detection method used by humans was, of course, based on simple visual inspection. After the invention of the microscope (possibly the greatest optical invention ever), material inspection techniques took a great leap forward. In recent decades, with the invention of the laser and other advances in science and technology, there have been dramatic improvements in existing optical inspection techniques and the creation of many new ones. In this issue, we have collected four papers from different areas of optics that highlight important advances that have been made in material inspection techniques.

© Optical Society of America

ToC Category:
Focus Issue: Optical methods for material inspection

History
Original Manuscript: June 22, 1998
Published: June 22, 1998

Citation
Michael Duncan and M. Bashkansky, "Introduction," Opt. Express 2, 515-515 (1998)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-2-13-515


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