OSA's Digital Library

Optics Express

Optics Express

  • Editor: J. H. Eberly
  • Vol. 2, Iss. 13 — Jun. 22, 1998
  • pp: 540–545

Subsurface defect detection in materials using optical coherence tomography

M. D. Duncan, M. Bashkansky, and J. Reintjes  »View Author Affiliations


Optics Express, Vol. 2, Issue 13, pp. 540-545 (1998)
http://dx.doi.org/10.1364/OE.2.000540


View Full Text Article

Enhanced HTML    Acrobat PDF (324 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

We have used optical coherence tomography to study the internal structure of a variety of non-biological materials. In particular, we have imaged internal regions from a commercial grade of lead zirconate titanate ceramic material, from a sample of single-crystal silicon carbide, and from a Teflon-coated wire. In each case the spatial positions of internal defects were determined.

© Optical Society of America

OCIS Codes
(110.4500) Imaging systems : Optical coherence tomography
(120.4290) Instrumentation, measurement, and metrology : Nondestructive testing
(290.7050) Scattering : Turbid media

ToC Category:
Focus Issue: Optical methods for material inspection

History
Original Manuscript: March 26, 1998
Published: June 22, 1998

Citation
Michael Duncan, Mark Bashkansky, and John Reintjes, "Subsurface defect detection in materials using optical coherence tomography," Opt. Express 2, 540-545 (1998)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-2-13-540


Sort:  Journal  |  Reset  

References

  1. R. C. Youngquist, S. Carr, and D. E. N. Davies, "Optical coherence-domain reflectometry: a new optical evaluation technique," Opt. Lett. 12, 158-160 (1987). [CrossRef] [PubMed]
  2. K. Takada, I. Yokohama, K. Chida, and J. Noda, "New measurement system for fault location in optical waveguide devices based on an interferometric technique," Appl. Opt. 26, 1063 (1987). [CrossRef]
  3. A. F. Fercher, K. Mengedoht, W. Werner, "Eye-length measurement by interferometry with partially coherent light," Opt. Lett. 13, 186-188 (1988). [CrossRef] [PubMed]
  4. E. A. Swanson, D. Huang, M. R. Hee, J. G. Fujimoto, C. P. Lin, and C. A. Puliafito, "High-speed optical coherence domain reflectometry," Opt. Lett. 17, 151-153 (1992). [CrossRef] [PubMed]
  5. V. M. Gelikonov, G. V. Gelikonov, R. V. Kuranov, K. I. Pravdenko, A. M. Sergeev, F. I. Feldshtein, Ya. I. Khanin, and D. V. Shabanov, "Coherent optical tomography of microscopic inhomogeneities in biological tissues," JETP Lett. 61, 159 (1995).
  6. M. Bashkansky, M. D. Duncan, M. Kahn, D. Lewis, III and J. Reintjes, "Subsurface Defect Detection in Ceramics Using Optical Gated Techniques," Opt. Lett. 22, 61-63 (1997). [CrossRef] [PubMed]
  7. J. A. Powell and D. J. Larkin, "Process-induced morphological defects in epitaxial CVD silicon carbide," Phys. Status Solidi B 202, 529-548 (1997). [CrossRef]
  8. J. F. de Boer, T. E. Milner, M. J. C. van Gemert, J. S. Nelson, "Two-dimensional birefringence imaging in biological tissue by polarization-sensitive optical coherence tomography," Opt. Lett. 22, 934-936 (1997). [CrossRef] [PubMed]

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.

Supplementary Material


» Media 1: MOV (810 KB)     
» Media 2: MOV (729 KB)     
» Media 3: MOV (1038 KB)     

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited