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Optics Express

Optics Express

  • Editor: J. H. Eberly
  • Vol. 2, Iss. 13 — Jun. 22, 1998
  • pp: 540–545

Subsurface defect detection in materials using optical coherence tomography

M. D. Duncan, M. Bashkansky, and J. Reintjes  »View Author Affiliations

Optics Express, Vol. 2, Issue 13, pp. 540-545 (1998)

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We have used optical coherence tomography to study the internal structure of a variety of non-biological materials. In particular, we have imaged internal regions from a commercial grade of lead zirconate titanate ceramic material, from a sample of single-crystal silicon carbide, and from a Teflon-coated wire. In each case the spatial positions of internal defects were determined.

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OCIS Codes
(110.4500) Imaging systems : Optical coherence tomography
(120.4290) Instrumentation, measurement, and metrology : Nondestructive testing
(290.7050) Scattering : Turbid media

ToC Category:
Focus Issue: Optical methods for material inspection

Original Manuscript: March 26, 1998
Published: June 22, 1998

Michael Duncan, Mark Bashkansky, and John Reintjes, "Subsurface defect detection in materials using optical coherence tomography," Opt. Express 2, 540-545 (1998)

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