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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 20, Iss. 10 — May. 7, 2012
  • pp: 11166–11177

Oblique incidence ellipsometric characterization and the substrate dependence of visible frequency fishnet metamaterials

Thomas W.H. Oates, Babak Dastmalchi, Goran Isic, Sajjad Tollabimazraehno, Christian Helgert, Thomas Pertsch, Ernst-Bernhard Kley, Marc A. Verschuuren, Iris Bergmair, Kurt Hingerl, and Karsten Hinrichs  »View Author Affiliations

Optics Express, Vol. 20, Issue 10, pp. 11166-11177 (2012)

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We use spectroscopic ellipsometry to investigate the angular-dependent optical modes of fishnet metamaterials fabricated by nanoimprint lithography. Spectroscopic ellipsometry is demonstrated as a fast and efficient method for metamaterial characterization and the measured polarization ratios significantly simplify the calibration procedures compared to reflectance and transmittance measurements. We show that the modes can be well identified by a combination of comparing different substrates and considering the angular dependence of the Wood’s anomalies. The lack of angular dispersion of the anti-symmetric gap-modes does not agree with the model and requires further theoretical investigation.

© 2012 OSA

OCIS Codes
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(160.3918) Materials : Metamaterials

ToC Category:

Original Manuscript: March 8, 2012
Revised Manuscript: April 2, 2012
Manuscript Accepted: April 2, 2012
Published: April 30, 2012

Thomas W.H. Oates, Babak Dastmalchi, Goran Isic, Sajjad Tollabimazraehno, Christian Helgert, Thomas Pertsch, Ernst-Bernhard Kley, Marc A. Verschuuren, Iris Bergmair, Kurt Hingerl, and Karsten Hinrichs, "Oblique incidence ellipsometric characterization and the substrate dependence of visible frequency fishnet metamaterials," Opt. Express 20, 11166-11177 (2012)

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