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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 20, Iss. 11 — May. 21, 2012
  • pp: 11637–11642

Work function shifts of catalytic metals under hydrogen gas visualized by terahertz chemical microscopy

Toshihiko Kiwa, Takafumi Hagiwara, Mitsuhiro Shinomiya, Kenji Sakai, and Keiji Tsukada  »View Author Affiliations

Optics Express, Vol. 20, Issue 11, pp. 11637-11642 (2012)

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Terahertz chemical microscopy (TCM) was applied to visualize the distribution of the work function shift of catalytic metals under hydrogen gas. TCM measures the chemical potential on the surface of a SiO2/Si/sapphire sensing plate without any contact with the plate. By controlling the bias voltage between an electrode on the SiO2 surface and the Si layer, the relationship between the voltage and the THz amplitude from the sensing plate can be obtained. As a demonstration, two types of structures were fabricated on the sensing plate, and the work function shifts due to catalytic reactions were visualized.

© 2012 OSA

OCIS Codes
(180.5810) Microscopy : Scanning microscopy
(320.7160) Ultrafast optics : Ultrafast technology

ToC Category:
Ultrafast Optics

Original Manuscript: March 16, 2012
Revised Manuscript: April 30, 2012
Manuscript Accepted: May 2, 2012
Published: May 7, 2012

Toshihiko Kiwa, Takafumi Hagiwara, Mitsuhiro Shinomiya, Kenji Sakai, and Keiji Tsukada, "Work function shifts of catalytic metals under hydrogen gas visualized by terahertz chemical microscopy," Opt. Express 20, 11637-11642 (2012)

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  1. K. Tsukada, M. Kariya, T. Yamaguchi, T. Kiwa, H. Yamada, T. Maehara, T. Yamamoto, and S. Kunitsugu, “Dual-gate field-effect transistor hydrogen gas sensor with thermal compensation,” Jpn. J. Appl. Phys.49(2), 024206 (2010). [CrossRef]
  2. T. Yamaguchi, T. Kiwa, K. Tsukada, and K. Yokosawa, “Oxygen interference mechanism of platinum-FET hydrogen gas sensor,” Sens. Actuators, A136, 244–248 (2007).
  3. T. Yamaguchi, M. Takisawa, T. Kiwa, H. Yamada, and K. Tsukada, “Analysis of response mechanism of a proton-pumping gate FET hydrogen gas sensor in air,” Sens. Actuators, B133, 538–542 (2008).
  4. M. Burgmair, H. P. Frerichs, M. Zimmer, M. Lehmann, and I. Eisele, “Field effect transducers for work function gas measurements: device improvements and comparison of performance,” Sens. Actuators, B95, 183–188 (2003).
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  8. T. Kiwa, M. Tonouchi, M. Yamashita, and K. Kawase, “Laser terahertz-emission microscope for inspecting electrical faults in integrated circuits,” Opt. Lett.28(21), 2058–2060 (2003). [CrossRef] [PubMed]
  9. H. Murakami, N. Uchida, R. Inoue, S. Kim, T. Kiwa, and M. Tonouchi, “Laser terahertz emission microscope,” Proc. IEEE95(8), 1646–1657 (2007). [CrossRef]
  10. M. Yamashita, K. Kawase, C. Otani, T. Kiwa, and M. Tonouchi, “Imaging of large-scale integrated circuits using laser-terahertz emission microscopy,” Opt. Express13(1), 115–120 (2005). [CrossRef] [PubMed]
  11. T. Kiwa, J. Kondo, S. Oka, I. Kawayama, H. Yamada, M. Tonouchi, and K. Tsukada, “Chemical sensing plate with a laser-terahertz monitoring system,” Appl. Opt.47(18), 3324–3327 (2008). [CrossRef] [PubMed]
  12. T. Kiwa, Y. Kondo, Y. Minami, I. Kawayama, M. Tonouchi, and K. Tsukada, “Terahertz chemical microscope for label-free detection of protein complex,” Appl. Phys. Lett.96(21), 211114 (2010). [CrossRef]
  13. T. Kiwa, S. Oka, J. Kondo, I. Kawayama, H. Yamada, M. Tonouchi, and K. Tsukada, “A terahertz chemical microscope to visualize chemical concentrations in microfluidic chips,” Jpn. J. Appl. Phys.46(44), L1052–L1054 (2007). [CrossRef]
  14. T. Kiwa, K. Tsukada, M. Suzuki, M. Tonouchi, S. Migitaka, and K. Yokosawa, “Laser terahertz emission system to investigate hydrogen gas sensors,” Appl. Phys. Lett.86(26), 261102 (2005). [CrossRef]
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