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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 20, Iss. 12 — Jun. 4, 2012
  • pp: 13173–13188

Quasi-analytical model for scattering infrared near-field microscopy on layered systems

Benedikt Hauer, Andreas P. Engelhardt, and Thomas Taubner  »View Author Affiliations

Optics Express, Vol. 20, Issue 12, pp. 13173-13188 (2012)

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We present a quantitative quasi-analytical model to predict and analyze signals on layered samples measured by infrared scattering-type scanning near-field optical microscopy. Our model predictions are compared to experimental data and to fully retarded calculations based on a point dipole approximation of the tip. The model is used to study the influence of the tip vibration amplitude and of the tip radius on the near-field contrasts of samples with particularly small variations in the layer thickness. Additionally the influence of a dielectric capping layer on the tip–substrate coupling is analyzed. When inversely applied, our calculation opens the possibility to extract the local layer thickness of thin films or the dielectric functions that allow one to draw conclusions on the material composition, conductivity or crystal structure on the nanoscale.

© 2012 OSA

OCIS Codes
(240.0310) Optics at surfaces : Thin films
(300.6340) Spectroscopy : Spectroscopy, infrared
(180.4243) Microscopy : Near-field microscopy
(290.5825) Scattering : Scattering theory

ToC Category:

Original Manuscript: April 3, 2012
Revised Manuscript: May 16, 2012
Manuscript Accepted: May 16, 2012
Published: May 25, 2012

Virtual Issues
Vol. 7, Iss. 8 Virtual Journal for Biomedical Optics

Benedikt Hauer, Andreas P. Engelhardt, and Thomas Taubner, "Quasi-analytical model for scattering infrared near-field microscopy on layered systems," Opt. Express 20, 13173-13188 (2012)

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