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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 20, Iss. 13 — Jun. 18, 2012
  • pp: 14632–14647

Spectral-interference microscopy for characterization of functional plasmonic elements

Christian Rewitz, Thomas Keitzl, Philip Tuchscherer, Sebastian Goetz, Peter Geisler, Gary Razinskas, Bert Hecht, and Tobias Brixner  »View Author Affiliations


Optics Express, Vol. 20, Issue 13, pp. 14632-14647 (2012)
http://dx.doi.org/10.1364/OE.20.014632


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Abstract

Plasmonic modes supported by noble-metal nanostructures offer strong subwavelength electric-field confinement and promise the realization of nanometer-scale integrated optical circuits with well-defined functionality. In order to measure the spectral and spatial response functions of such plasmonic elements, we combine a confocal microscope setup with spectral interferometry detection. The setup, data acquisition, and data evaluation are discussed in detail by means of exemplary experiments involving propagating plasmons transmitted through silver nanowires. By considering and experimentally calibrating any setup-inherent signal delay with an accuracy of 1 fs, we are able to extract correct timing information of propagating plasmons. The method can be applied, e.g., to determine the dispersion and group velocity of propagating plasmons in nanostructures, and can be extended towards the investigation of nonlinear phenomena.

© 2012 OSA

OCIS Codes
(120.4820) Instrumentation, measurement, and metrology : Optical systems
(130.2790) Integrated optics : Guided waves
(180.3170) Microscopy : Interference microscopy
(180.5810) Microscopy : Scanning microscopy
(300.6310) Spectroscopy : Spectroscopy, heterodyne
(320.7120) Ultrafast optics : Ultrafast phenomena
(250.5403) Optoelectronics : Plasmonics
(320.7085) Ultrafast optics : Ultrafast information processing

ToC Category:
Microscopy

History
Original Manuscript: April 18, 2012
Manuscript Accepted: May 20, 2012
Published: June 15, 2012

Citation
Christian Rewitz, Thomas Keitzl, Philip Tuchscherer, Sebastian Goetz, Peter Geisler, Gary Razinskas, Bert Hecht, and Tobias Brixner, "Spectral-interference microscopy for characterization of functional plasmonic elements," Opt. Express 20, 14632-14647 (2012)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-20-13-14632


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