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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 20, Iss. 14 — Jul. 2, 2012
  • pp: 14833–14847

Bi-frequency correlation properties of the scattered intensity from dielectric rough surfaces

Geng Zhang and Zhensen Wu  »View Author Affiliations

Optics Express, Vol. 20, Issue 14, pp. 14833-14847 (2012)

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The analytical expression for the Bi-frequency correlation function of the intensity scattered from two-dimensional dielectric randomly rough surfaces obeying Gaussian distribution are presented based on the scalar Kirchhoff approximation theory with the root-mean-square (rms) slope of the surface less than 0.25 and the Gaussian moment theorem. The results show that the bi-frequency correlation properties of the scattered intensity closely depend on the incident and scattered conditions as well as on the statistical parameters and complex refractive index of the surface. Especially, the correlation function mainly comes from the specular direction, and the coherence bandwidth and the function decrease with the increase of the roughness of the rough surface. In addition, comparing with the real part, the imagery of the complex refractive index has a greater impact on the bi-frequency correlation function.

© 2012 OSA

OCIS Codes
(030.6600) Coherence and statistical optics : Statistical optics
(290.5880) Scattering : Scattering, rough surfaces
(140.3538) Lasers and laser optics : Lasers, pulsed
(290.5855) Scattering : Scattering, polarization

ToC Category:

Original Manuscript: May 10, 2012
Revised Manuscript: June 1, 2012
Manuscript Accepted: June 2, 2012
Published: June 18, 2012

Geng Zhang and Zhensen Wu, "Bi-frequency correlation properties of the scattered intensity from dielectric rough surfaces," Opt. Express 20, 14833-14847 (2012)

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