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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 20, Iss. 14 — Jul. 2, 2012
  • pp: 15045–15053

Mueller matrix measurements and modeling pertaining to Spectralon white reflectance standards

Øyvind Svensen, Morten Kildemo, Jerome Maria, Jakob J. Stamnes, and Øyvind Frette  »View Author Affiliations

Optics Express, Vol. 20, Issue 14, pp. 15045-15053 (2012)

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The full Mueller matrix for a Spectralon white reflectance standard was measured in the incidence plane, to obtain the polarization state of the scattered light for different angles of illumination. The experimental setup was a Mueller matrix ellipsometer, by which measurements were performed for scattering angles measured relative to the normal of the Spectralon surface from −90° to 90° sampled at every 2.5° for an illumination wavelength of 532 nm. Previously, the polarization of light scattered from Spectralon white reflectance standards was measured only for four of the elements of the Muller matrix. As in previous investigations, the reflection properties of the Spectralon white reflectance standard was found to be close to those of a Lambertian surface for small scattering and illumination angles. At large scattering and illumination angles, all elements of the Mueller matrix were found to deviate from those of a Lambertian surface. A simple empirical model with only two parameters, was developed, and used to simulate the measured results with fairly good accuracy.

© 2012 OSA

OCIS Codes
(290.1350) Scattering : Backscattering
(290.1990) Scattering : Diffusion
(290.5820) Scattering : Scattering measurements
(290.5855) Scattering : Scattering, polarization

ToC Category:

Original Manuscript: April 19, 2012
Manuscript Accepted: May 23, 2012
Published: June 20, 2012

Virtual Issues
Vol. 7, Iss. 9 Virtual Journal for Biomedical Optics

Øyvind Svensen, Morten Kildemo, Jerome Maria, Jakob J. Stamnes, and Øyvind Frette, "Mueller matrix measurements and modeling pertaining to Spectralon white reflectance standards," Opt. Express 20, 15045-15053 (2012)

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  1. “A guide to diffuse reflectance coatings & materials;” http://www.prolite.co.uk/File/coatings materials documentation.php .
  2. “Reflectance standards product sheet 8.pdf” http://www.labsphere.com/data/userFiles/ .
  3. E. A. Early, P. Y. Barnes, B. C. Johnson, J. J. Butler, C. J. Bruegge, S. F. Biggar, P. R. Spyak, and M. M. Pavlov, “Bidirectional reflectance round-robin in support of the Earth observing system program,” Am. Met. Soc.17, 1078–1091 (2000).
  4. D. A. Haner, B. T. McGuckin, and C. J. Bruegge, “Polarization characteristics of Spectralon illuminated by coherent light,” Appl. Opt.38(30), 6350–6356 (1999). [CrossRef] [PubMed]
  5. B. Gordon, “Integrating sphere diffuse reflectance technology for use with UV-Visible spectroscopy;” Tech. Note: 51450, Thermo Fisher Scientific, WI, USA.
  6. D. A. Haner, B. T. McGuckin, R. T. Menzies, C. J. Bruegge, and V. Duval, “Directional-hemispherical reflectance for spectralon by integration of its bidirectional reflectance,” Appl. Opt.37(18), 3996–3999 (1998). [CrossRef] [PubMed]
  7. K. J. Voss and H. Zhang, “Bidirectional reflectance of dry and submerged Labsphere Spectralon plaque,” Appl. Opt.45(30), 7924–7927 (2006). [CrossRef] [PubMed]
  8. G. T. Georgiev and J. J. Butler, “The effect of incident light polarization on Spectralon BRDF measurements,” Proc. SPIE5570, 492–502 (2004). [CrossRef]
  9. AA. Bhandari, B. Hamre, Ø. Frette, L. Zhao, J. J. Stamnes, and M. Kildemo, “Bidirectional reflectance distribution function of Spectralon white reflectance standard illuminated by incoherent unpolarized and plane-polarized light,” Appl. Opt.50(16), 2431–2442 (2011). [CrossRef] [PubMed]
  10. G. T. Georgiev and J. J. Butler, “The effect of speckle on BRDF measurements,” Proc. SPIE588, 588203 (2005).
  11. B. T. McGuckin, D. A. Haner, R. T. Menzies, C. Esproles, and A. M. Brothers, “Directional reflectance characterization facility and measurement methodology,” Appl. Opt.35(24), 4827–4834 (1996). [CrossRef] [PubMed]
  12. M. Chami, “Importance of the polarization in the retrieval of oceanic constituents from the remote sensing reflectance,” J. Geophys. Res.112(C5), 5026–5039 (2007). [CrossRef]
  13. G. D. Gilbert and J. C. Pernicka, “Improvement of underwater visibility by reduction of backscatter with a circular polarization technique,” Appl. Opt.6(4), 741–746 (1967). [CrossRef] [PubMed]
  14. G. Yao, “Differential optical polarization imaging in turbid media with different embedded objects,” Opt. Commun.241(4-6), 255–261 (2004). [CrossRef]
  15. G. W. Kattawar and D. J. Gray, “Mueller matrix imaging of targets in turbid media: effect of the volume scattering function,” Appl. Opt.42(36), 7225–7230 (2003). [CrossRef] [PubMed]
  16. P. W. Zhai, G. W. Kattawar, and P. Yang, “Mueller matrix imaging of targets under an air-sea interface,” Appl. Opt.48(2), 250–260 (2009). [CrossRef] [PubMed]
  17. J. S. Tyo, D. L. Goldstein, D. B. Chenault, and J. A. Shaw, “Review of passive imaging polarimetry for remote sensing applications,” Appl. Opt.45(22), 5453–5469 (2006). [CrossRef] [PubMed]
  18. F. Stabo-Eeg, M. Kildemo, I. S. Nerbo̸, and M. Lindgren, “Well-conditioned multiple laser Mueller matrix ellipsometer,” Opt. Eng.47(7), 073604 (2008). [CrossRef]
  19. P. S. Hauge, R. H. Muller, and C. G. Smith, “Conventions and formulas for using the Mueller-Stokes calculus in ellipsometry,” Surf. Sci.96(1-3), 81–107 (1980). [CrossRef]
  20. R. Ossikovski, M. Anastasiadou, S. Ben Hatit, E. Garcia-Caurel, and A. De Martino, “Depolarising Mueller matrices: how to decompose them?” Phys. Status Solidi205(4), 720–727 (2008). [CrossRef]
  21. R. Ossikovski, “Interpretation of nondepolarizing Mueller matrices based on singular-value decomposition,” J. Opt. Soc. Am. A25(2), 473–482 (2008). [CrossRef] [PubMed]
  22. J. J. Gil and E. Bernabeu, “Depolarization and polarization indices of an optical system,” Opt. Acta (Lond.)33(2), 185–189 (1986). [CrossRef]
  23. F. Le Roy-Bréhonnet, B. Le Jeune, P. Eliés, J. Cariou, and J. Lotrain, “Optical media and target characterization by Mueller matrix decomposition,” Appl. Phys. (Berl.)29, 34–38 (1996).

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