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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 20, Iss. 14 — Jul. 2, 2012
  • pp: 15723–15733

Two-dimensional wavefront reconstruction from lateral multi-shear interferograms

Yun-feng Guo, Hao Chen, Ji Xu, and Jianping Ding  »View Author Affiliations

Optics Express, Vol. 20, Issue 14, pp. 15723-15733 (2012)

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We propose and demonstrate multiple shearing interferometry for measuring two-dimensional phase object. Multi-shear interference can effectively eliminate the problem of spectral leakage that results from the single-shear interference. The Fourier coefficients of a two-dimensional wavefront are computed from phase differences obtained from multiple shearing interferograms, which are acquired by a shearing interferometer, and the desired phase is then reconstructed. Numerical and optical tests have confirmed that the multiple shearing interferometry has a higher recovery accuracy than single-shear interferometry and the reconstruction precision increases as the number of shear steps increases.

© 2012 OSA

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(070.2465) Fourier optics and signal processing : Finite analogs of Fourier transforms

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: February 9, 2012
Revised Manuscript: April 13, 2012
Manuscript Accepted: June 19, 2012
Published: June 27, 2012

Yun-feng Guo, Hao Chen, Ji Xu, and Jianping Ding, "Two-dimensional wavefront reconstruction from lateral multi-shear interferograms," Opt. Express 20, 15723-15733 (2012)

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