OSA's Digital Library

Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 20, Iss. 14 — Jul. 2, 2012
  • pp: 16129–16144

Oscillations in spectral behavior of total losses (1 − RT) in thin dielectric films

Tatiana V. Amotchkina, Michael K. Trubetskov, Alexander V. Tikhonravov, Vesna Janicki, Jordi Sancho-Parramon, Olga Razskazovskaya, and Vladimir Pervak  »View Author Affiliations


Optics Express, Vol. 20, Issue 14, pp. 16129-16144 (2012)
http://dx.doi.org/10.1364/OE.20.016129


View Full Text Article

Enhanced HTML    Acrobat PDF (998 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

We explain reasons of oscillations frequently observed in total losses spectra (1 − RT) calculated on the basis of measurement spectral photometric data of thin film samples. The first reason of oscillations is related to difference in angles of incidence at which spectral transmittance and reflectance are measured. The second reason is an absorption in a thin film. The third reason is a slight thickness non-uniformity of the film. We observe a good agreement between theoretical models and corresponding measurements, which proves above statements on the origins of oscillations in total losses.

© 2012 OSA

OCIS Codes
(310.1620) Thin films : Interference coatings
(310.1860) Thin films : Deposition and fabrication
(310.3840) Thin films : Materials and process characterization
(310.6860) Thin films : Thin films, optical properties

ToC Category:
Thin Films

History
Original Manuscript: June 12, 2012
Manuscript Accepted: June 22, 2012
Published: June 29, 2012

Citation
Tatiana V. Amotchkina, Michael K. Trubetskov, Alexander V. Tikhonravov, Vesna Janicki, Jordi Sancho-Parramon, Olga Razskazovskaya, and Vladimir Pervak, "Oscillations in spectral behavior of total losses (1 − R − T) in thin dielectric films," Opt. Express 20, 16129-16144 (2012)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-20-14-16129


Sort:  Author  |  Year  |  Journal  |  Reset  

References

  1. A. Duparré and D. Ristau, “2004 topical meeting on optical interference coatings: Measurement problem,” in Optical Interference Coatings, OSA Technical Digest Series (Optical Society of America, 2004), paper WD1.
  2. A. Duparré and D. Ristau, “Optical interference coatings 2007 measurement problem,” Appl. Opt.47, C179–C184 (2008). [CrossRef] [PubMed]
  3. A. Duparré and D. Ristau, “Optical interference coatings 2010 measurement problem,” Appl. Opt.50, C172–C177 (2011). [CrossRef] [PubMed]
  4. A. V. Tikhonravov, M. K. Trubetskov, T. V. Amotchkina, G. DeBell, V. Pervak, A. K. Sytchkova, M. L. Grilli, and D. Ristau, “Optical parameters of oxide films typically used in optical coating production,” Appl. Opt.50, C75–C85 (2011). [CrossRef] [PubMed]
  5. A. V. Tikhonravov, M. K. Trubetskov, M. A. Kokarev, T. V. Amotchkina, A. Duparré, E. Quesnel, D. Ristau, and S. Günster, “Effect of systematic errors in spectral photometric data on the accuracy of determination of optical parameters of dielectric thin films,” Appl. Opt.41, 2555–2560 (2002). [CrossRef] [PubMed]
  6. J. Woollam, “Ellipsometry, variable angle spectroscopic,” in “Wiley Encyclopedia of Electrical and Electronics Engineering,” J. Webster, ed. (Wiley, New York, 2000). Supplement 1.
  7. A. Tikhonravov, M. Trubetskov, T. Amotchkina, A. Tikhonravov, D. Ristau, and S. Günster, “Reliable determination of wavelength dependence of thin film refractive index,” Proc. SPIE5188, 331–342 (2003). [CrossRef]
  8. T. Amotchkina, D. Ristau, M. Lappschies, M. Jupé, A. V. Tikhonravov, and M. K. Trubetskov, “Optical properties of TiO2–SiO2 mixture thin films produced by ion-beam sputtering,” in Optical Interference Coatings, OSA Technical Digest Series (Optical Society of America, 2007), paper TuA8.
  9. S. Furman and A. V. Tikhonravov, Basics of Optics of Multilayer Systems (Edition Frontieres, 1992).
  10. Quartz Glass for Optics: Data and Properties, http://heraeus-quarzglas.com .
  11. A. V. Tikhonravov and M. K. Trubetskov, OptiLayer thin film software, http://www.optilayer.com .
  12. V. Pervak, A. V. Tikhonravov, M. K. Trubetskov, J. Pistner, F. Krausz, and A. Apolonski, “Band filters: 2-material technology versus rugate,” Appl. Opt.46, 1190–1193 (2007). [CrossRef] [PubMed]
  13. V. Pervak, F. Krausz, and A. Apolonski, “Hafnium oxide thin films deposited by reactive middle-frequency dual-magnetron sputtering,” Thin Solid Films515, 7984–7989 (2007). [CrossRef]
  14. A. Tikhonravov, M. Trubetskov, and G. DeBell, “On the accuracy of optical thin film parameter determination based on spectrophotometric data,” Proc. SPIE5188, 190–199 (2003). [CrossRef]
  15. J. A. Dobrowolski, F. C. Ho, and A. Waldorf, “Determination of optical constants of thin film coating materials based on inverse synthesis,” Appl. Opt.22, 3191–3200 (1983). [CrossRef] [PubMed]
  16. A. V. Tikhonravov, T. V. Amotchkina, M. K. Trubetskov, R. Francis, V. Janicki, J. Sancho-Parramon, H. Zorc, and V. Pervak, “Optical characterization and reverse engineering based on multiangle spectroscopy,” Appl. Opt.51, 245–254 (2012). [CrossRef] [PubMed]
  17. P. A. van Nijnatten, “An automated directional reflectance/transmittance analyser for coating analysis,” Thin Solid Films442, 74–79 (2003). [CrossRef]
  18. H. A. Macleod, Thin Film Optical Filters (McGraw-Hill, 1986). [CrossRef]

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.


« Previous Article

OSA is a member of CrossRef.

CrossCheck Deposited