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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 20, Iss. 16 — Jul. 30, 2012
  • pp: 17374–17379

Experimental demonstration of the three phase shifted DFB semiconductor laser based on Reconstruction-Equivalent-Chirp technique

Yuechun Shi, Xiangfei Chen, Yating Zhou, Simin Li, Lianyan Li, and Yijun Feng  »View Author Affiliations

Optics Express, Vol. 20, Issue 16, pp. 17374-17379 (2012)

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A three phase shifted (3PS) distributed feedback (DFB) semiconductor laser based on Reconstruction-Equivalent-Chirp (REC) technique is experimentally demonstrated for the first time. The simulation results show that the performances of the equivalent 3PS DFB semiconductor laser are nearly the same as that of the true 3PS laser. However, it only changes the μm-level sampling structures but the seed grating is uniform. So, its cost of fabrication is low. The measurement results exhibit its good single longitudinal mode (SLM) operation even at high bias current and surrounding temperature.

© 2012 OSA

OCIS Codes
(140.3490) Lasers and laser optics : Lasers, distributed-feedback
(140.5960) Lasers and laser optics : Semiconductor lasers

ToC Category:
Lasers and Laser Optics

Original Manuscript: May 29, 2012
Revised Manuscript: July 8, 2012
Manuscript Accepted: July 8, 2012
Published: July 16, 2012

Yuechun Shi, Xiangfei Chen, Yating Zhou, Simin Li, Lianyan Li, and Yijun Feng, "Experimental demonstration of the three phase shifted DFB semiconductor laser based on Reconstruction-Equivalent-Chirp technique," Opt. Express 20, 17374-17379 (2012)

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