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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 20, Iss. 17 — Aug. 13, 2012
  • pp: 19382–19394

Complex refractive index variation in proton-damaged diamond

S. Lagomarsino, P. Olivero, S. Calusi, D. Gatto Monticone, L. Giuntini, M. Massi, S. Sciortino, A. Sytchkova, A. Sordini, and M. Vannoni  »View Author Affiliations


Optics Express, Vol. 20, Issue 17, pp. 19382-19394 (2012)
http://dx.doi.org/10.1364/OE.20.019382


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Abstract

An accurate control of the optical properties of single crystal diamond during microfabrication processes such as ion implantation plays a crucial role in the engineering of integrated photonic devices. In this work we present a systematic study of the variation of both real and imaginary parts of the refractive index of single crystal diamond, when damaged with 2 and 3 MeV protons at low-medium fluences (range: 1015 - 1017 cm−2). After implanting in 125 × 125 μm2 areas with a scanning ion microbeam, the variation of optical pathlength of the implanted regions was measured with laser interferometric microscopy, while their optical transmission was studied using a spectrometric set-up with micrometric spatial resolution. On the basis of a model taking into account the strongly non-uniform damage profile in the bulk sample, the variation of the complex refractive index as a function of damage density was evaluated.

© 2012 OSA

OCIS Codes
(120.6650) Instrumentation, measurement, and metrology : Surface measurements, figure
(160.4760) Materials : Optical properties
(180.3170) Microscopy : Interference microscopy
(300.6190) Spectroscopy : Spectrometers

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: March 27, 2012
Revised Manuscript: May 13, 2012
Manuscript Accepted: May 14, 2012
Published: August 9, 2012

Citation
S. Lagomarsino, P. Olivero, S. Calusi, D. Gatto Monticone, L. Giuntini, M. Massi, S. Sciortino, A. Sytchkova, A. Sordini, and M. Vannoni, "Complex refractive index variation in proton-damaged diamond," Opt. Express 20, 19382-19394 (2012)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-20-17-19382


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