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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 20, Iss. 18 — Aug. 27, 2012
  • pp: 20028–20042

Vulnerability of CMOS image sensors in megajoule class laser harsh environment

V. Goiffon, S. Girard, A. Chabane, P. Paillet, P. Magnan, P. Cervantes, P. Martin-Gonthier, J. Baggio, M. Estribeau, J.-L. Bourgade, S. Darbon, A. Rousseau, V. Yu. Glebov, G. Pien, and T. C. Sangster  »View Author Affiliations

Optics Express, Vol. 20, Issue 18, pp. 20028-20042 (2012)

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CMOS image sensors (CIS) are promising candidates as part of optical imagers for the plasma diagnostics devoted to the study of fusion by inertial confinement. However, the harsh radiative environment of Megajoule Class Lasers threatens the performances of these optical sensors. In this paper, the vulnerability of CIS to the transient and mixed pulsed radiation environment associated with such facilities is investigated during an experiment at the OMEGA facility at the Laboratory for Laser Energetics (LLE), Rochester, NY, USA. The transient and permanent effects of the 14 MeV neutron pulse on CIS are presented. The behavior of the tested CIS shows that active pixel sensors (APS) exhibit a better hardness to this harsh environment than a CCD. A first order extrapolation of the reported results to the higher level of radiation expected for Megajoule Class Laser facilities (Laser Megajoule in France or National Ignition Facility in the USA) shows that temporarily saturated pixels due to transient neutron-induced single event effects will be the major issue for the development of radiation-tolerant plasma diagnostic instruments whereas the permanent degradation of the CIS related to displacement damage or total ionizing dose effects could be reduced by applying well known mitigation techniques.

© 2012 OSA

OCIS Codes
(040.1240) Detectors : Arrays
(040.6070) Detectors : Solid state detectors
(110.2970) Imaging systems : Image detection systems
(250.3140) Optoelectronics : Integrated optoelectronic circuits
(350.5610) Other areas of optics : Radiation
(280.4788) Remote sensing and sensors : Optical sensing and sensors
(280.5395) Remote sensing and sensors : Plasma diagnostics

ToC Category:

Original Manuscript: June 27, 2012
Revised Manuscript: August 1, 2012
Manuscript Accepted: August 2, 2012
Published: August 16, 2012

V. Goiffon, S. Girard, A. Chabane, P. Paillet, P. Magnan, P. Cervantes, P. Martin-Gonthier, J. Baggio, M. Estribeau, J.-L. Bourgade, S. Darbon, A. Rousseau, V. Yu. Glebov, G. Pien, and T. C. Sangster, "Vulnerability of CMOS image sensors in megajoule class laser harsh environment," Opt. Express 20, 20028-20042 (2012)

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