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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 20, Iss. 2 — Jan. 16, 2012
  • pp: 1862–1867

A simple method to measure critical angles for high-sensitivity differential refractometry

S. C. Zilio  »View Author Affiliations


Optics Express, Vol. 20, Issue 2, pp. 1862-1867 (2012)
http://dx.doi.org/10.1364/OE.20.001862


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Abstract

A total internal reflection-based differencial refractometer, capable of measuring the real and imaginary parts of the complex refractive index in real time, is presented. The device takes advantage of the phase difference acquired by s- and p-polarized light to generate an easily detectable minimum at the reflected profile. The method allows to sensitively measuring transparent and turbid liquid samples.

© 2012 OSA

OCIS Codes
(230.0230) Optical devices : Optical devices
(260.6970) Physical optics : Total internal reflection
(290.7050) Scattering : Turbid media
(280.4788) Remote sensing and sensors : Optical sensing and sensors

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: November 21, 2011
Revised Manuscript: December 27, 2011
Manuscript Accepted: December 27, 2011
Published: January 12, 2012

Virtual Issues
Vol. 7, Iss. 3 Virtual Journal for Biomedical Optics

Citation
S. C. Zilio, "A simple method to measure critical angles for high-sensitivity differential refractometry," Opt. Express 20, 1862-1867 (2012)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-20-2-1862


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References

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  9. http://refractiveindex.inf
  10. S. C. Zilio, “Refratômetro diferencial para medir o índice de refração e coeficiente de atenuação de um líquido em tempo real”, Patent pending.

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