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Ultra-compact, high-Q silicon microdisk reflectors |
Optics Express, Vol. 20, Issue 20, pp. 21840-21846 (2012)
http://dx.doi.org/10.1364/OE.20.021840
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Abstract
We demonstrate wavelength-selective reflectors based on silicon microdisk resonators integrated with compact Y-branch splitters, using a CMOS-photonics technology. A high quality factor (Q) of ∼ 88,000 was measured in the reflection spectrum for a 2.5-μm-radius device with a small footprint of 6 × 17 μm2 and a wide free-spectral range (FSR) of over 41 nm. As the radius is reduced to 1.5 μm, corresponding to a device footprint of 4 × 15 μm2, the spectrum shows an ultra-wide FSR of over 71 nm with the compromise of having a reduced Q of ∼ 4000. The coupling between a microdisk and a waveguide is numerically investigated. We further propose a multichannel sensing system using cascaded microdisk reflectors.
© 2012 OSA
OCIS Codes
(120.5700) Instrumentation, measurement, and metrology : Reflection
(130.6010) Integrated optics : Sensors
(230.7020) Optical devices : Traveling-wave devices
(230.4555) Optical devices : Coupled resonators
(130.7408) Integrated optics : Wavelength filtering devices
ToC Category:
Integrated Optics
History
Original Manuscript: July 6, 2012
Revised Manuscript: August 14, 2012
Manuscript Accepted: August 23, 2012
Published: September 10, 2012
Citation
Wei Shi, Han Yun, Wen Zhang, Charlie Lin, Ting Kai Chang, Yun Wang, Nicolas A. F. Jaeger, and Lukas Chrostowski, "Ultra-compact, high-Q silicon microdisk reflectors," Opt. Express 20, 21840-21846 (2012)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-20-20-21840
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