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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 20, Iss. 20 — Sep. 24, 2012
  • pp: 22079–22086

Characterization of passive optical components with ultra-fast speed and high-resolution based on DD-OFDM

Banghong Guo, Tao Gui, Zhaohui Li, Yuan Bao, Xingwen Yi, Jianping Li, Xinhuan Feng, and Songhao Liu  »View Author Affiliations


Optics Express, Vol. 20, Issue 20, pp. 22079-22086 (2012)
http://dx.doi.org/10.1364/OE.20.022079


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Abstract

The passive optical components with very fine structures in wavelength domain are very sensitive to the mechanical vibrations or thermal fluctuations. If the measurement speed is lower than the temperature and mechanical fluctuation, we cannot measure the dynamic characteristics of the optical components. In this paper, we propose and demonstrate a novel method with ultra-fast measurement speed and high-resolution based on optical channel estimation using direct-detected orthogonal frequency division multiplexing (DD-OFDM) signal, which can be used to measure the dynamic characteristics and fine structure of the passive optical components. In experiment, by using fast Fourier transform (FFT) and a low-cost electro-absorption modulated laser (EML), we can achieve the transfer function characteristics with 3.9MHz resolution. Compared with the optical channel estimation using coherent OFDM signal reported before, the proposed measurement technique is cost-effective.

© 2012 OSA

OCIS Codes
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(220.4840) Optical design and fabrication : Testing

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: June 4, 2012
Revised Manuscript: August 18, 2012
Manuscript Accepted: August 24, 2012
Published: September 12, 2012

Citation
Banghong Guo, Tao Gui, Zhaohui Li, Yuan Bao, Xingwen Yi, Jianping Li, Xinhuan Feng, and Songhao Liu, "Characterization of passive optical components with ultra-fast speed and high-resolution based on DD-OFDM," Opt. Express 20, 22079-22086 (2012)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-20-20-22079


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