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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 20, Iss. 20 — Sep. 24, 2012
  • pp: 22531–22536

Fabrication and characterization of suspended SiO2 ridge optical waveguides and the devices

Pengxin Chen, Yunpeng Zhu, Yaocheng Shi, Daoxin Dai, and Sailing He  »View Author Affiliations


Optics Express, Vol. 20, Issue 20, pp. 22531-22536 (2012)
http://dx.doi.org/10.1364/OE.20.022531


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Abstract

Novel suspended SiO2 ridge optical waveguides on silicon are fabricated and characterized. The present suspended SiO2 ridge optical waveguide has a SiO2 ridge core surrounded by air. The propagation loss and the bend loss measured are about 0.385dB/cm and 0.037dB/90° respectively for the fabricated 1μm-wide waveguides with a bending radius of 100μm when operating at the wavelength of 1550 nm. With the present suspended SiO2 optical waveguides, a small racetrack resonator with a radius of 100μm is also demonstrated and the measured Q-factor is about 3160.

© 2012 OSA

OCIS Codes
(230.3120) Optical devices : Integrated optics devices

ToC Category:
Optical Devices

History
Original Manuscript: June 13, 2012
Revised Manuscript: August 23, 2012
Manuscript Accepted: September 6, 2012
Published: September 17, 2012

Citation
Pengxin Chen, Yunpeng Zhu, Yaocheng Shi, Daoxin Dai, and Sailing He, "Fabrication and characterization of suspended SiO2 ridge optical waveguides and the devices," Opt. Express 20, 22531-22536 (2012)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-20-20-22531


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