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Novel approach to optical profiler with gradient focal point methods |
Optics Express, Vol. 20, Issue 21, pp. 23061-23073 (2012)
http://dx.doi.org/10.1364/OE.20.023061
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Abstract
Novel gradient focal point (GFP) methods by use of the gradient curvature cylindrical lens, the gradient thickness cylindrical lens and a tilted imaging sensor are proposed for the optical profiler. With the employed simple idea that the different divergence angle of an input beam to the lens generates the different focal position, the height information of one point can be obtained just in a single-shot by GFP approaches. The feasibility of the proposed system is demonstrated to be an alternative to optical profilers.
© 2012 OSA
OCIS Codes
(080.3620) Geometric optics : Lens system design
(120.6650) Instrumentation, measurement, and metrology : Surface measurements, figure
(180.6900) Microscopy : Three-dimensional microscopy
ToC Category:
Instrumentation, Measurement, and Metrology
History
Original Manuscript: July 20, 2012
Revised Manuscript: August 28, 2012
Manuscript Accepted: September 13, 2012
Published: September 24, 2012
Citation
Henzeh Leeghim, MyoungKi Ahn, and Kwangsoo Kim, "Novel approach to optical profiler with gradient focal point methods," Opt. Express 20, 23061-23073 (2012)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-20-21-23061
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References
- R. Jang, C. S. Kang, J. A. Kim, J. W. Kim, J. E. Kim, and H. Y. Park, “High-speed measurement of three-dimensional surface profiles up to 10 μm using two-wavelength phase-shifting interferometry utilizing an injection locking technique,” Appl. Opt.50(11), 1541–1547 (2011). [CrossRef] [PubMed]
- J. A. Kim, C. S. Kang, J. Jin, C. Eom, R. Jang, and J. W. Kim, “Note: High speed optical profiler based on a phase-shifting technique using frequency-scanning lasers,” Rev. Sci. Instrum.82(8), 086111 (2011). [CrossRef] [PubMed]
- J. Gass, A. Dakoff, and M. K. Kim, “Phase imaging without 2π ambiguity by multiwavelength digital holography,” Opt. Lett.28(13), 1141–1143 (2003). [CrossRef] [PubMed]
- J. Kühn, T. Colomb, F. Montfort, F. Charrière, Y. Emery, E. Cuche, P. Marquet, and C. Depeursinge, “Real-time dual-wavelength digital holographic microscopy with a single hologram acquisition,” Opt. Express15(12), 7231–7242 (2007). [CrossRef] [PubMed]
- J. Min, B. Yao, P. Gao, R. Guo, B. Ma, J. Zheng, M. Lei, S. Yan, D. Dan, T. Duan, Y. Yang, and T. Ye, “Dual-wavelength slightly off-axis digital holographic microscopy,” Appl. Opt.51(2), 191–196 (2012). [CrossRef] [PubMed]
- X. Jiang, K. Wang, F. Gao, and H. Muhamedsalih, “Fast surface measurement using wavelength scanning interferometry with compensation of environmental noise,” Appl. Opt.49(15), 2903–2909 (2010). [CrossRef] [PubMed]
- B. Bowe and V. Toal, “White light interferometric surface profiler,” Opt. Eng.37(6), 1796–1799 (1998). [CrossRef]
- A. Hirabayashi, H. Ogawa, and K. Kitagawa, “Fast surface profiler by white-light interferometry by use of a new algorithm based on sampling theory,” Appl. Opt.41(23), 4876–4883 (2002). [CrossRef] [PubMed]
- H. J. Tiziani and H. M. Uhde, “Three-dimensional image sensing by chromatic confocal microscopy,” Appl. Opt.33(10), 1838–1843 (1994). [CrossRef] [PubMed]
- K. Shi, P. Li, S. Yin, and Z. Liu, “Chromatic confocal microscopy using supercontinuum light,” Opt. Express12(10), 2096–2101 (2004). [CrossRef] [PubMed]
- B. S. Chun, K. Kim, and D. Gweon, “Three-dimensional surface profile measurement using a beam scanning chromatic confocal microscope,” Rev. Sci. Instrum.80(7), 073706 (2009). [CrossRef] [PubMed]
- W. J. Smith, “Paraxial optics and calculations,” in Modern Optical Engineering, 4th ed. (SPIE Press, 2008), pp. 35–48.
- T. S. Tkaczyk, “Microscope construction,” in Field Guide to Microscopy (SPIE Press, 2010), p. 36.
- R. E. Fischer, B. T. Galeb, and P. R. Yoder, “Basic optics and optical system specification,” in Optical System Design, 2nd ed. (SPIE Press, 2008), pp. 17–20.
- J. W. Goodman, “Fresnel and Fraunhofer diffraction,” in Introduction to Fourier Optics, 3rd ed. (Roberts & Company Publishers, 2005), pp. 76–79.
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