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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 20, Iss. 21 — Oct. 8, 2012
  • pp: 23480–23488

Analysis on enhanced depth of field for integral imaging microscope

Young-Tae Lim, Jae-Hyeung Park, Ki-Chul Kwon, and Nam Kim  »View Author Affiliations


Optics Express, Vol. 20, Issue 21, pp. 23480-23488 (2012)
http://dx.doi.org/10.1364/OE.20.023480


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Abstract

Depth of field of the integral imaging microscope is studied. In the integral imaging microscope, 3-D information is encoded as a form of elemental images Distance between intermediate plane and object point decides the number of elemental image and depth of field of integral imaging microscope. From the analysis, it is found that depth of field of the reconstructed depth plane image by computational integral imaging reconstruction is longer than depth of field of optical microscope. From analyzed relationship, experiment using integral imaging microscopy and conventional microscopy is also performed to confirm enhanced depth of field of integral imaging microscopy.

© 2012 OSA

OCIS Codes
(100.6890) Image processing : Three-dimensional image processing
(110.0180) Imaging systems : Microscopy
(170.6900) Medical optics and biotechnology : Three-dimensional microscopy

ToC Category:
Microscopy

History
Original Manuscript: July 6, 2012
Revised Manuscript: September 1, 2012
Manuscript Accepted: September 24, 2012
Published: September 27, 2012

Citation
Young-Tae Lim, Jae-Hyeung Park, Ki-Chul Kwon, and Nam Kim, "Analysis on enhanced depth of field for integral imaging microscope," Opt. Express 20, 23480-23488 (2012)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-20-21-23480


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