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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 20, Iss. 21 — Oct. 8, 2012
  • pp: 23582–23586

Echelle grating silicon multi/demultiplexers with single-reflection total internal reflectors

Sahnggi Park, Sang-Gi Kim, Jeagyu Park, and Gyungock Kim  »View Author Affiliations


Optics Express, Vol. 20, Issue 21, pp. 23582-23586 (2012)
http://dx.doi.org/10.1364/OE.20.023582


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Abstract

We present a silicon-on-insulator Echelle grating 8-channel demutiplexer showing characteristic features, average insertion loss 2.4 dB measured at 1520~1570 nm, adjacent channel crosstalk 15-18 dB, and channel spacing 11.9 nm. Our Echelle grating is remarked by a total internal reflector (TIR) which reflects incident light by a single reflection in contrast to the double reflections of retro-reflector TIR Echelle gratings.

© 2012 OSA

OCIS Codes
(130.3120) Integrated optics : Integrated optics devices
(230.7390) Optical devices : Waveguides, planar
(130.7408) Integrated optics : Wavelength filtering devices

ToC Category:
Integrated Optics

History
Original Manuscript: July 31, 2012
Revised Manuscript: September 23, 2012
Manuscript Accepted: September 24, 2012
Published: September 28, 2012

Citation
Sahnggi Park, Sang-Gi Kim, Jeagyu Park, and Gyungock Kim, "Echelle grating silicon multi/demultiplexers with single-reflection total internal reflectors," Opt. Express 20, 23582-23586 (2012)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-20-21-23582


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References

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