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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 20, Iss. 21 — Oct. 8, 2012
  • pp: 23610–23616

Reduced dark counts in optimized geometries for superconducting nanowire single photon detectors

Mohsen K. Akhlaghi, Haig Atikian, Amin Eftekharian, Marko Loncar, and A. Hamed Majedi  »View Author Affiliations

Optics Express, Vol. 20, Issue 21, pp. 23610-23616 (2012)

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We have experimentally compared the critical current, dark count rate and photo-response of 100nm wide superconducting nanowires with different bend designs. Enhanced critical current for nanowires with optimally rounded bends, and thus with no current crowding, are observed. Furthermore, we find that the optimally designed bend significantly reduces the dark counts without compromising the photo-response of the device. The results can lead to major improvements in superconducting nanowire single photon detectors.

© 2012 OSA

OCIS Codes
(040.0040) Detectors : Detectors
(040.5570) Detectors : Quantum detectors
(270.5570) Quantum optics : Quantum detectors

ToC Category:

Original Manuscript: July 19, 2012
Revised Manuscript: September 16, 2012
Manuscript Accepted: September 26, 2012
Published: October 1, 2012

Mohsen K. Akhlaghi, Haig Atikian, Amin Eftekharian, Marko Loncar, and A. Hamed Majedi, "Reduced dark counts in optimized geometries for superconducting nanowire single photon detectors," Opt. Express 20, 23610-23616 (2012)

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