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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 20, Iss. 21 — Oct. 8, 2012
  • pp: 23865–23874

Chalmers interferometric test using a reflective spatial light modulator

B. Canales-Pacheco, A. Cornejo-Rodríguez, and F. Granados-Agustín  »View Author Affiliations

Optics Express, Vol. 20, Issue 21, pp. 23865-23874 (2012)

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In this paper, we propose the use of a reflective spatial light modulator (RSLM) controlled by a PC, instead of a metal plate with holes, to produce the interference patterns in Chalmers interferometric test. The main advantage of the proposed method is that with an RSLM, it is possible to test and obtain an interference pattern for any zone of a surface or lens by opening two appropriate apertures. This increases the accuracy of the results and reduces the time required to obtain them.

© 2012 OSA

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(220.4840) Optical design and fabrication : Testing

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: June 8, 2012
Revised Manuscript: August 9, 2012
Manuscript Accepted: August 10, 2012
Published: October 3, 2012

B. Canales-Pacheco, A. Cornejo-Rodríguez, and F. Granados-Agustín, "Chalmers interferometric test using a reflective spatial light modulator," Opt. Express 20, 23865-23874 (2012)

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