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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 20, Iss. 22 — Oct. 22, 2012
  • pp: 24167–24174

Line scan - structured illumination microscopy super-resolution imaging in thick fluorescent samples

Ondrej Mandula, Martin Kielhorn, Kai Wicker, Gerhard Krampert, Ingo Kleppe, and Rainer Heintzmann  »View Author Affiliations

Optics Express, Vol. 20, Issue 22, pp. 24167-24174 (2012)

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Structured illumination microscopy in thick fluorescent samples is a challenging task. The out-of-focus fluorescence background deteriorates the illumination pattern and the reconstructed images suffer from influence of noise. We present a combination of structured illumination microscopy with line scanning. This technique reduces the out-of-focus fluorescence background, which improves the modulation and the quality of the illumination pattern and therefore facilitates the reconstruction. We present super-resolution, optically sectioned images of a thick fluorescent sample, revealing details of the specimen’s inner structure.

© 2012 OSA

OCIS Codes
(180.0180) Microscopy : Microscopy
(180.2520) Microscopy : Fluorescence microscopy

ToC Category:

Original Manuscript: June 28, 2012
Revised Manuscript: August 8, 2012
Manuscript Accepted: September 26, 2012
Published: October 8, 2012

Ondrej Mandula, Martin Kielhorn, Kai Wicker, Gerhard Krampert, Ingo Kleppe, and Rainer Heintzmann, "Line scan - structured illumination microscopy super-resolution imaging in thick fluorescent samples," Opt. Express 20, 24167-24174 (2012)

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