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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 20, Iss. 22 — Oct. 22, 2012
  • pp: 24167–24174

Line scan - structured illumination microscopy super-resolution imaging in thick fluorescent samples

Ondrej Mandula, Martin Kielhorn, Kai Wicker, Gerhard Krampert, Ingo Kleppe, and Rainer Heintzmann  »View Author Affiliations


Optics Express, Vol. 20, Issue 22, pp. 24167-24174 (2012)
http://dx.doi.org/10.1364/OE.20.024167


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Abstract

Structured illumination microscopy in thick fluorescent samples is a challenging task. The out-of-focus fluorescence background deteriorates the illumination pattern and the reconstructed images suffer from influence of noise. We present a combination of structured illumination microscopy with line scanning. This technique reduces the out-of-focus fluorescence background, which improves the modulation and the quality of the illumination pattern and therefore facilitates the reconstruction. We present super-resolution, optically sectioned images of a thick fluorescent sample, revealing details of the specimen’s inner structure.

© 2012 OSA

OCIS Codes
(180.0180) Microscopy : Microscopy
(180.2520) Microscopy : Fluorescence microscopy

ToC Category:
Microscopy

History
Original Manuscript: June 28, 2012
Revised Manuscript: August 8, 2012
Manuscript Accepted: September 26, 2012
Published: October 8, 2012

Citation
Ondrej Mandula, Martin Kielhorn, Kai Wicker, Gerhard Krampert, Ingo Kleppe, and Rainer Heintzmann, "Line scan - structured illumination microscopy super-resolution imaging in thick fluorescent samples," Opt. Express 20, 24167-24174 (2012)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-20-22-24167


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References

  1. M. G. Gustafsson, “Surpassing the lateral resolution limit by a factor of two using structured illumination microscopy,” J. Microsc.198(2), 82–87 (2000). [CrossRef] [PubMed]
  2. R. Heintzmann and C. Cremer, “Laterally modulated excitation microscopy: improvement of resolution by using a diffraction grating,” in Proc. SPIE. (SPIE, 1999), 3568, 185–196.
  3. L. Schermelleh, P. M. Carlton, S. Haase, L. Shao, L. Winoto, P. Kner, B. Burke, M. C. Cardoso, D. A. Agard, M. G. L. Gustafsson, H. Leonhardt, and J. W. Sedat, “Subdiffraction multicolor imaging of the nuclear periphery with 3D structured illumination microscopy,” Science320(5881), 1332–1336 (2008). [CrossRef] [PubMed]
  4. P. A. Benedetti, V. Evangelista, D. Guidarini, and S. Vestri, “U.S. Patent 6016367,” (1997).
  5. A. G. York, S. H. Parekh, D. D. Nogare, R. S. Fischer, K. Temprine, M. Mione, A. B. Chitnis, C. A. Combs, and H. Shroff, “Resolution doubling in live, multicellular organisms via multifocal structured illumination microscopy,” Nat. Methods9(7), 749–754 (2012). [CrossRef] [PubMed]
  6. I. J. Cox, C. J. R. Sheppard, and T. Wilson, “Improvement in resolution by nearly confocal microscopy,” Appl. Opt.21(5), 778–781 (1982). [CrossRef] [PubMed]
  7. C. J. R. Sheppard, “Super-resolution in confocal imaging,” Optik (Stuttg.)80, 53–54 (1988).
  8. M. A. Neil, R. Juskaitis, and T. Wilson, “Method of obtaining optical sectioning by using structured light in a conventional microscope,” Opt. Lett.22(24), 1905–1907 (1997). [CrossRef] [PubMed]
  9. V. Poher, G. T. Kennedy, H. B. Manning, D. M. Owen, H. X. Zhang, E. Gu, M. D. Dawson, P. M. French, and M. A. Neil, “Improved sectioning in a slit scanning confocal microscope,” Opt. Lett.33(16), 1813–1815 (2008). [CrossRef] [PubMed]
  10. T. Kim, D. Gweon, and J. H. Lee, “Enhancement of fluorescence confocal scanning microscopy lateral resolution by use of structured illumination,” Meas. Sci. Technol.20(5), 055501 (2009). [CrossRef]
  11. R. Heintzmann, “Structured illumination methods,” in Handbook of Biological Confocal Microscopy (Springer, 2006), pp. 265–279.
  12. R. Heintzmann and P. A. Benedetti, “High-resolution image reconstruction in fluorescence microscopy with patterned excitation,” Appl. Opt.45(20), 5037–5045 (2006). [CrossRef] [PubMed]
  13. Kai. Wicker, PhD thesis, King’s College London, (2010).
  14. E. J. Botcherby, M. J. Booth, R. Juskaitis, and T. Wilson, “Real-time slit scanning microscopy in the meridional plane,” Opt. Lett.34(10), 1504–1506 (2009). [CrossRef] [PubMed]
  15. R. Heintzmann, “Saturated patterned excitation microscopy with two-dimensional excitation patterns,” Micron34(6-7), 283–291 (2003). [CrossRef] [PubMed]

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