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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 20, Iss. 22 — Oct. 22, 2012
  • pp: 24977–24986

Wavefront measurement for a hard-X-ray nanobeam using single-grating interferometry

Satoshi Matsuyama, Hikaru Yokoyama, Ryosuke Fukui, Yoshiki Kohmura, Kenji Tamasaku, Makina Yabashi, Wataru Yashiro, Atsushi Momose, Tetsuya Ishikawa, and Kazuto Yamauchi  »View Author Affiliations


Optics Express, Vol. 20, Issue 22, pp. 24977-24986 (2012)
http://dx.doi.org/10.1364/OE.20.024977


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Abstract

Wavefront measurement for a hard-X-ray nanobeam using single-grating interferometry based on the Talbot effect and the Fourier transform method was demonstrated in the 1-km-long beamline of SPring-8. 10 keV X-rays were one-dimensionally focused down to 32 nm using a total-reflection elliptical mirror. An intentionally distorted wavefront was generated using a deformable mirror placed just upstream of the focusing mirror. The wavefront measured by interferometry was cross-checked with the phase retrieval method using intensity profiles around the beam waist. Comparison of the obtained wavefront errors revealed that they are in good agreement with each other and with the wavefront error estimated from the shape of the deformable mirror at a ~0.5 rad level.

© 2012 OSA

OCIS Codes
(340.7450) X-ray optics : X-ray interferometry
(340.7470) X-ray optics : X-ray mirrors

ToC Category:
X-ray Optics

History
Original Manuscript: July 25, 2012
Revised Manuscript: October 11, 2012
Manuscript Accepted: October 11, 2012
Published: October 17, 2012

Citation
Satoshi Matsuyama, Hikaru Yokoyama, Ryosuke Fukui, Yoshiki Kohmura, Kenji Tamasaku, Makina Yabashi, Wataru Yashiro, Atsushi Momose, Tetsuya Ishikawa, and Kazuto Yamauchi, "Wavefront measurement for a hard-X-ray nanobeam using single-grating interferometry," Opt. Express 20, 24977-24986 (2012)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-20-22-24977


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