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Wavefront measurement for a hard-X-ray nanobeam using single-grating interferometrySatoshi Matsuyama, Hikaru Yokoyama, Ryosuke Fukui, Yoshiki Kohmura, Kenji Tamasaku, Makina Yabashi, Wataru Yashiro, Atsushi Momose, Tetsuya Ishikawa, and Kazuto Yamauchi »View Author Affiliations
Satoshi Matsuyama,1,*
Hikaru Yokoyama,1
Ryosuke Fukui,1
Yoshiki Kohmura,2
Kenji Tamasaku,2
Makina Yabashi,2
Wataru Yashiro,3
Atsushi Momose,3
Tetsuya Ishikawa,2
and Kazuto Yamauchi1,4,5
1Department of Precision Science and Technology, Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan 2RIKEN/SPring-8, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5148, Japan 3Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan 4CREST, JST, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan 5Research Center for Ultra-Precision Science and Technology, Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan *Corresponding author: matsuyama@prec.eng.osaka-u.ac.jp |
Optics Express, Vol. 20, Issue 22, pp. 24977-24986 (2012)
http://dx.doi.org/10.1364/OE.20.024977
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Abstract
Wavefront measurement for a hard-X-ray nanobeam using single-grating interferometry based on the Talbot effect and the Fourier transform method was demonstrated in the 1-km-long beamline of SPring-8. 10 keV X-rays were one-dimensionally focused down to 32 nm using a total-reflection elliptical mirror. An intentionally distorted wavefront was generated using a deformable mirror placed just upstream of the focusing mirror. The wavefront measured by interferometry was cross-checked with the phase retrieval method using intensity profiles around the beam waist. Comparison of the obtained wavefront errors revealed that they are in good agreement with each other and with the wavefront error estimated from the shape of the deformable mirror at a ~0.5 rad level.
© 2012 OSA
OCIS Codes
(340.7450) X-ray optics : X-ray interferometry
(340.7470) X-ray optics : X-ray mirrors
ToC Category:
X-ray Optics
History
Original Manuscript: July 25, 2012
Revised Manuscript: October 11, 2012
Manuscript Accepted: October 11, 2012
Published: October 17, 2012
Citation
Satoshi Matsuyama, Hikaru Yokoyama, Ryosuke Fukui, Yoshiki Kohmura, Kenji Tamasaku, Makina Yabashi, Wataru Yashiro, Atsushi Momose, Tetsuya Ishikawa, and Kazuto Yamauchi, "Wavefront measurement for a hard-X-ray nanobeam using single-grating interferometry," Opt. Express 20, 24977-24986 (2012)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-20-22-24977
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Nat. Phys.
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Opt. Express
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Philos. Mag.
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Phys. Rev. A
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Rev. Sci. Instrum.
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Other
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2012, Rutishauser, Nat Commun
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