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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 20, Iss. 22 — Oct. 22, 2012
  • pp: 25152–25160

A scheme for lensless X-ray microscopy combining coherent diffraction imaging and differential corner holography

F. Capotondi, E. Pedersoli, M. Kiskinova, A.V. Martin, M. Barthelmess, and H. N. Chapman  »View Author Affiliations

Optics Express, Vol. 20, Issue 22, pp. 25152-25160 (2012)

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We successfully use the corners of a common silicon nitride supporting window in lensless X-ray microscopy as extended references in differential holography to obtain a real space hologram of the illuminated object. Moreover, we combine this method with the iterative phasing techniques of coherent diffraction imaging to enhance the spatial resolution on the reconstructed object, and overcome the problem of missing areas in the collected data due to the presence of a beam stop, achieving a resolution close to 85 nm.

© 2012 OSA

OCIS Codes
(090.0090) Holography : Holography
(100.3010) Image processing : Image reconstruction techniques
(100.5070) Image processing : Phase retrieval
(110.7440) Imaging systems : X-ray imaging

ToC Category:

Original Manuscript: June 18, 2012
Revised Manuscript: July 24, 2012
Manuscript Accepted: July 24, 2012
Published: October 19, 2012

F. Capotondi, E. Pedersoli, M. Kiskinova, A.V. Martin, M. Barthelmess, and H. N. Chapman, "A scheme for lensless X-ray microscopy combining coherent diffraction imaging and differential corner holography," Opt. Express 20, 25152-25160 (2012)

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