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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 20, Iss. 24 — Nov. 19, 2012
  • pp: 26167–26175

Differential near-edge coherent diffractive imaging using a femtosecond high-harmonic XUV light source

Fabian Weise, Daniel M. Neumark, Stephen R. Leone, and Oliver Gessner  »View Author Affiliations


Optics Express, Vol. 20, Issue 24, pp. 26167-26175 (2012)
http://dx.doi.org/10.1364/OE.20.026167


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Abstract

Element-specific contrast enhancement in tabletop coherent diffractive imaging (CDI) is demonstrated by employing an ultrafast extreme ultraviolet (XUV) light source with tunable photon energy. By combining two measurements performed at energies below and above the Al L2,3 absorption edge, the spatial autocorrelation function of a micron-scale double pinhole in a 300 nm thick aluminum foil is retrieved despite a dominant background signal from directly transmitted light across the entire range of detectable diffraction angles. The fringe visibility in the diffraction patterns is 0 below the Al L2,3 edge, 0.53 ± 0.06 above the edge, and 0.73 ± 0.08 in the differential image that combines the two measurements. The proof-of-principle experiment demonstrates that the variations of XUV optical constants in the vicinity of an inner-shell absorption edge can be utilized to improve the chemical sensitivity and image reconstruction quality of laboratory-based ultrafast imaging experiments.

© 2012 OSA

OCIS Codes
(110.7440) Imaging systems : X-ray imaging
(190.2620) Nonlinear optics : Harmonic generation and mixing
(340.7480) X-ray optics : X-rays, soft x-rays, extreme ultraviolet (EUV)

ToC Category:
X-ray Optics

History
Original Manuscript: August 27, 2012
Revised Manuscript: October 19, 2012
Manuscript Accepted: October 21, 2012
Published: November 5, 2012

Citation
Fabian Weise, Daniel M. Neumark, Stephen R. Leone, and Oliver Gessner, "Differential near-edge coherent diffractive imaging using a femtosecond high-harmonic XUV light source," Opt. Express 20, 26167-26175 (2012)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-20-24-26167


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