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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 20, Iss. 24 — Nov. 19, 2012
  • pp: 26337–26344

Sideband spectroscopy and dispersion measurement in microcavities

Jiang Li, Hansuek Lee, Ki Youl Yang, and Kerry J. Vahala  »View Author Affiliations


Optics Express, Vol. 20, Issue 24, pp. 26337-26344 (2012)
http://dx.doi.org/10.1364/OE.20.026337


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Abstract

The measurement of dispersion and its control have become important considerations in nonlinear devices based on microcavities. A sideband technique is applied here to accurately measure dispersion in a microcavity resulting from both geometrical and material contributions. Moreover, by combining the method with finite element simulations, we show that mapping of spectral lines to their corresponding transverse mode families is possible. The method is applicable for high-Q, micro-cavities having microwave rate free spectral range and has a relative precision of 5.5 × 10−6 for a 2 mm disk cavity with FSR of 32.9382 GHz and Q of 150 milllion.

© 2012 OSA

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(130.3120) Integrated optics : Integrated optics devices
(300.6380) Spectroscopy : Spectroscopy, modulation
(140.3945) Lasers and laser optics : Microcavities

ToC Category:
Integrated Optics

History
Original Manuscript: September 17, 2012
Revised Manuscript: October 31, 2012
Manuscript Accepted: November 1, 2012
Published: November 7, 2012

Citation
Jiang Li, Hansuek Lee, Ki Youl Yang, and Kerry J. Vahala, "Sideband spectroscopy and dispersion measurement in microcavities," Opt. Express 20, 26337-26344 (2012)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-20-24-26337


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