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High-quality LiNbO3 microdisk resonators by undercut etching and surface tension reshaping |
Optics Express, Vol. 20, Issue 27, pp. 28119-28124 (2012)
http://dx.doi.org/10.1364/OE.20.028119
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Abstract
We report ultra-smooth LiNbO3 microdisk resonators fabricated by selective ion implantation, chemical etching, and thermal treatment. The undercut microdisk structure is produced by chemically etching the buried lattice damage layer formed by selective ion implantation. By thermal treatment, surface tension smoothes and reshapes microdisk surface topography. The resonant characteristics of microdisk resonators are simulated by finite element method and are well consistent with the experimental results. The 20μm-diameter microdisk resonator has the FSR of 16.43nm and the Q factor of 2.60 × 104. The produced LiNbO3 microdisk resonators can be utilized in new microdisk applications with electro-optic and nonlinear-optic effects.
© 2012 OSA
OCIS Codes
(130.3730) Integrated optics : Lithium niobate
(230.3120) Optical devices : Integrated optics devices
(230.5750) Optical devices : Resonators
ToC Category:
Integrated Optics
History
Original Manuscript: October 10, 2012
Revised Manuscript: November 21, 2012
Manuscript Accepted: November 23, 2012
Published: December 4, 2012
Citation
Tzyy-Jiann Wang, Jheng-Yu He, Cheng-An Lee, and Huan Niu, "High-quality LiNbO3 microdisk resonators by undercut etching and surface tension reshaping," Opt. Express 20, 28119-28124 (2012)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-20-27-28119
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