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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 20, Iss. 28 — Dec. 31, 2012
  • pp: 29329–29337

Experimental verification of femtosecond laser ablation schemes by time-resolved soft x-ray reflective imaging

Takuro Tomita, Minoru Yamamoto, Noboru Hasegawa, Kota Terakawa, Yasuo Minami, Masaharu Nishikino, Masahiko Ishino, Takeshi Kaihori, Yoshihiro Ochi, Tetsuya Kawachi, Mitsuru Yamagiwa, and Tohru Suemoto  »View Author Affiliations


Optics Express, Vol. 20, Issue 28, pp. 29329-29337 (2012)
http://dx.doi.org/10.1364/OE.20.029329


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Abstract

Pump and probe reflective imaging using a soft x-ray laser probe was applied to the observation of the early stage of femtosecond laser ablation process on platinum. In strongly excited area, drastic and fast reflectivity drop was observed. In moderately excited area, the decay of the reflectivity is slower than that in the strongly excited area, and the reflectivity reaches its minimum at t = 160 ps. In weakly excited area, laser-induced reflectivity change was not observed. In addition, the point where the reflectivity dip was observed at t = 10 ps and t = 40 ps, coincides with the position of the edge of reflectivity drop at t = 160 ps. These results give the critical information about the femtosecond laser ablation.

© 2012 OSA

OCIS Codes
(320.5390) Ultrafast optics : Picosecond phenomena
(340.7440) X-ray optics : X-ray imaging
(340.7480) X-ray optics : X-rays, soft x-rays, extreme ultraviolet (EUV)
(350.3390) Other areas of optics : Laser materials processing

ToC Category:
X-ray Optics

History
Original Manuscript: October 31, 2012
Revised Manuscript: December 7, 2012
Manuscript Accepted: December 9, 2012
Published: December 18, 2012

Citation
Takuro Tomita, Minoru Yamamoto, Noboru Hasegawa, Kota Terakawa, Yasuo Minami, Masaharu Nishikino, Masahiko Ishino, Takeshi Kaihori, Yoshihiro Ochi, Tetsuya Kawachi, Mitsuru Yamagiwa, and Tohru Suemoto, "Experimental verification of femtosecond laser ablation schemes by time-resolved soft x-ray reflective imaging," Opt. Express 20, 29329-29337 (2012)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-20-28-29329


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