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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 20, Iss. 4 — Feb. 13, 2012
  • pp: 3654–3662

Effects of laser polarization and interface orientation in harmonic generation microscopy

Uwe Petzold, Andreas Büchel, and Thomas Halfmann  »View Author Affiliations

Optics Express, Vol. 20, Issue 4, pp. 3654-3662 (2012)

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We present systematic experimental investigations on the effects of laser polarization and interface orientation in second and third harmonic generation microscopy. We find that the laser polarization has no measurable effect on signal strength and resolution in third harmonic microscopy, while the second harmonic strongly depends upon the polarization direction of the driving laser. Moreover, we observe a strong effect of the interface orientation with respect to the laser beam direction—both in second and third harmonic generation. This affects the signal strength, as well as the obtained transversal and longitudinal resolution in microscopic imaging. As an (on the first glance) surprising feature, also surfaces parallel to the optical axis of the laser beam yield strong harmonic signal. This enables applications of harmonic microscopy in specific geometries. As an example we monitor the flow of immiscible microfluids in lateral cut by third harmonic microscopy.

© 2012 OSA

OCIS Codes
(190.4160) Nonlinear optics : Multiharmonic generation
(190.4180) Nonlinear optics : Multiphoton processes
(180.4315) Microscopy : Nonlinear microscopy

ToC Category:

Original Manuscript: September 21, 2011
Revised Manuscript: November 30, 2011
Manuscript Accepted: December 30, 2011
Published: January 31, 2012

Virtual Issues
Vol. 7, Iss. 4 Virtual Journal for Biomedical Optics

Uwe Petzold, Andreas Büchel, and Thomas Halfmann, "Effects of laser polarization and interface orientation in harmonic generation microscopy," Opt. Express 20, 3654-3662 (2012)

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