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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 20, Iss. 4 — Feb. 13, 2012
  • pp: 3954–3966

Precise and rapid distance measurements by scatterometry

Tetsuya Hoshino, Toyohiko Yatagai, and Masahide Itoh  »View Author Affiliations


Optics Express, Vol. 20, Issue 4, pp. 3954-3966 (2012)
http://dx.doi.org/10.1364/OE.20.003954


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Abstract

We found that the distances between isolated scatterers with similar columnar shapes could be measured by taking a single Fourier transform of their diffraction intensity. If the scatterers have different shapes, the distances between similar shapes can be selected from the distances between all the shapes. The distance from a specific scatterer can be measured with a resolution of 0.8 wavelengths and a precision of 0.01 wavelengths. This technique has the potential to be used in a novel optical memory that has a memory density as high as that of holographic memory, while can be fabricated by simple transfer molding. We used rigorous coupled-wave analysis to calculate the diffraction intensity. Some of the results were verified by nonstandard finite-difference time-domain simulations and experiments.

© 2012 OSA

OCIS Codes
(210.4680) Optical data storage : Optical memories
(290.3700) Scattering : Linewidth
(070.2025) Fourier optics and signal processing : Discrete optical signal processing
(050.5745) Diffraction and gratings : Resonance domain

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: January 4, 2012
Manuscript Accepted: January 27, 2012
Published: February 1, 2012

Citation
Tetsuya Hoshino, Toyohiko Yatagai, and Masahide Itoh, "Precise and rapid distance measurements by scatterometry," Opt. Express 20, 3954-3966 (2012)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-20-4-3954


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