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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 20, Iss. 4 — Feb. 13, 2012
  • pp: 4419–4427

Spectroscopic ellipsometry as an optical probe of strain evolution in ferroelectric thin films

D. Y. Lei, S. Kéna-Cohen, B. Zou, P. K. Petrov, Y. Sonnefraud, J. Breeze, S. A. Maier, and N. M. Alford  »View Author Affiliations


Optics Express, Vol. 20, Issue 4, pp. 4419-4427 (2012)
http://dx.doi.org/10.1364/OE.20.004419


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Abstract

Heteroepitaxial strain in ferroelectric thin films is known to have a significant impact on both their low and high frequency dielectric properties. In this paper, we use ex-situ spectroscopic ellipsometry to study the strain evolution with film thickness, and strain relaxation in ferroelectric Ba0.5Sr0.5TiO3 epitaxial films grown on single crystal substrates. For films grown on MgO substrates, a critical thickness for strain relaxation is observed. In addition, studies of Ba0.5Sr0.5TiO3 films grown on different single crystal substrates reveal that the strain relaxation rate can be inferred from changes in the optical properties. Using this information, we show that the optical constants of Ba0.5Sr0.5TiO3 can be readily tuned via strain engineering.

© 2012 OSA

OCIS Codes
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(160.2260) Materials : Ferroelectrics
(310.6860) Thin films : Thin films, optical properties

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: November 23, 2011
Revised Manuscript: December 16, 2011
Manuscript Accepted: December 18, 2011
Published: February 8, 2012

Citation
D. Y. Lei, S. Kéna-Cohen, B. Zou, P. K. Petrov, Y. Sonnefraud, J. Breeze, S. A. Maier, and N. M. Alford, "Spectroscopic ellipsometry as an optical probe of strain evolution in ferroelectric thin films," Opt. Express 20, 4419-4427 (2012)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-20-4-4419


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References

  1. M. J. Lancaster, J. Powell, and A. Porch, “Thin-film ferroelectric microwave devices,” Supercond. Sci. Technol.11, 1323–1334 (1998). [CrossRef]
  2. N. Setter, D. Damjanovic, L. Eng, G. Fox, S. Gevorgian, S. Hong, A. Kingon, H. Kohlstedt, N. Y. Park, G. B. Stephenson, I. Stolitchnov, A. K. Taganstev, D. V. Taylor, T. Yamada, and S. Streiffer, “Ferroelectric thin films: Review of materials, properties, and applications,” J. Appl. Phys.100, 051606 (2006). [CrossRef]
  3. J. Hoffman, X. Pan, J. W. Reiner, F. J. Walker, J. P. Han, C. H. Ahn, and T. P. Ma, “Ferroelectric field effect transistors for memory applications,” Adv. Mater.22, 2957–2961 (2010). [CrossRef] [PubMed]
  4. H. Shin, H. J. Chang, R. W. Boyd, M. R. Choi, and W. Jo, “Large nonlinear optical response of polycrystalline Bi3.25La0.75Ti3O12 ferroelectric thin films on quartz substrates,” Opt. Lett.32, 2453–2455 (2007). [CrossRef] [PubMed]
  5. P. Li, Y. Liu, and Y. Meng, “Electrically controlled multifrequency ferroelectric cloak,” Opt. Express18, 12647–12652 (2010). [CrossRef]
  6. N. A. Pertsev, A. G. Zembilgotov, and A. K. Tagantsev, “Effect of mechanical boundary conditions on phase diagrams of epitaxial ferroelectric thin films,” Phys. Rev. Lett.80, 1988–1991 (1998). [CrossRef]
  7. J. H. Haeni, P. Irvin, W. Chang, R. Uecker, P. Reiche, Y. L. Li, S. Choudhury, W. Tian, M. E. Hawley, B. Craigo, A. K. Tagantsev, X. Q. Pan, S. K. Streiffer, L. Q. Chen, S. W. Kirchoefer, J. Levy, and D. G. Schlom, “Room-temperature ferroelectricity in strained SrTiO3,” Nature430, 758–761 (2004). [CrossRef] [PubMed]
  8. L. S.-J. Peng, X. X. Xi, B. H. Moeckly, and S. P. Alpay, “Strain relaxation during in situ growth of SrTiO3 thin films,” Appl. Phys. Lett.83, 4592 (2003). [CrossRef]
  9. J. Q. He, E. Vasco, R. Dittmann, and R. H. Wang, “Growth dynamics and strain relaxation mechanisms in BaTiO3 pulsed laser deposited on SrRuO3/SrTiO3,” Phys. Rev. B73, 125413 (2006). [CrossRef]
  10. B. Xiao, V. Avrutin, H. Liu, E. Rowe, J. Leach, X. Gu, Ü. Özgür, H. Morkoç, W. Chang, L. M. B. Alldredge, S. W. Kirchoefer, and J. M. Pond, “Effect of large strain on dielectric and ferroelectric properties of Ba0.5Sr0.5TiO3 thin films,” Appl. Phys. Lett.95, 012907 (2009). [CrossRef]
  11. P. Petrik, N.Q. Khánh, Z. E. Horváth, Z. Zolnai, I. Bársony, T. Lohner, M. Fried, J. Gyulai, C. Schmidt, C. Schneider, and H. Ryssel, “Characterisation of BaxSr1−xTiO3 films using spectroscopic ellipsometry, Rutherford backscattering spectrometry and X-ray diffraction,” J. Non-Cryst. Solids303, 179–184 (2002). [CrossRef]
  12. Z. Hu, G. Wang, Z. Huang, X. Meng, F. Shi, and J. Chu, “Investigations of the optical properties of Ba0.9Sr0.1TiO3 ferroelectric thin films by spectroscopic ellipsometry,” Jpn. J. Appl. Phys.42, 1400–1404 (2003). [CrossRef]
  13. Y. Gao, A. H. Mueller, E. A. Irene, O. Auciello, A. Krauss, and J. A. Schultz, “In situ study of interface reactions of ion beam sputter deposited (Ba0.5Sr0.5)TiO3 films on Si, SiO2, and Ir,” J. Vac. Sci. Technol. A17, 1880 (2009). [CrossRef]
  14. D. Y. Kim, S. E. Moon, E.-K. Kim, S.-J. Lee, J.-J. Choi, and H.-E. Kim, “Electro-optic characteristics of (001)-oriented Ba0.6Sr0.4TiO3 thin films,” Appl. Phys. Lett.82, 1455 (2003). [CrossRef]
  15. K. Takeda, T. Muraishi, T. Hoshina, H. Kakemoto, and T. Tsurumi, “Birefringence and electro-optic effect in epitaxial BST thin films,” Mater. Sci. Eng. B161, 61 (2009). [CrossRef]
  16. Y. Q. Wang, W. S. Liang, P. K. Petrov, and N. M. Alford, “Dissociation of misfit and threading dislocations in Ba0.75Sr0.25TiO3 epitaxial films,” Mater. Charact.62, 294–297 (2011). [CrossRef]
  17. P. K. Petrov, K. Sarma, and N. M. Alford, “Evaluation of residual stress in thin ferroelectric films using grazing incident X-ray diffraction,” Integr. Ferroelectr.63, 183–189 (2004). [CrossRef]
  18. J. A. Woollam Co., Inc., “Guide to using WVASE32: software for spectroscopic ellipsometry data acquisition and analysis,” Lincoln, NE, USA (1995).
  19. T. Schimizu, “The effect of strain on the permittivity of SrTiO3 from first-principles study,” Solid State Commun.102, 523–527 (1997). [CrossRef]

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