Self-validating technique for the measurement of the linewidth enhancement factor in semiconductor lasers

doi:10.1364/OE.20.004979

Self-validating technique for the measurement of the linewidth enhancement factor in semiconductor lasers

Antonio Consoli, Borja Bonilla, Jose Manuel G. Tijero, and Ignacio Esquivias »View Author Affiliations

Optics Express, Vol. 20, Issue 5, pp. 4979-4987 (2012)
http://dx.doi.org/10.1364/OE.20.004979

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Abstract

A new method for measuring the linewidth enhancement factor (α-parameter) of semiconductor lasers is proposed and discussed. The method itself provides an estimation of the measurement error, thus self-validating the entire procedure. The α-parameter is obtained from the temporal profile and the instantaneous frequency (chirp) of the pulses generated by gain switching. The time resolved chirp is measured with a polarization based optical differentiator. The accuracy of the obtained values of the α-parameter is estimated from the comparison between the directly measured pulse spectrum and the spectrum reconstructed from the chirp and the temporal profile of the pulse. The method is applied to a VCSEL and to a DFB laser emitting around 1550 nm at different temperatures, obtaining a measurement error lower than ± 8%.

OCIS Codes
(060.4510) Fiber optics and optical communications : Optical communications
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(140.5960) Lasers and laser optics : Semiconductor lasers
(250.7260) Optoelectronics : Vertical cavity surface emitting lasers
(140.3538) Lasers and laser optics : Lasers, pulsed

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: January 11, 2012
Revised Manuscript: February 2, 2012
Manuscript Accepted: February 7, 2012
Published: February 13, 2012

Citation
Antonio Consoli, Borja Bonilla, Jose Manuel G. Tijero, and Ignacio Esquivias, "Self-validating technique for the measurement of the linewidth enhancement factor in semiconductor lasers," Opt. Express 20, 4979-4987 (2012)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-20-5-4979

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References

C. H. Henry, “Theory of the linewidth of semiconductor lasers,” IEEE J. Quantum Electron.18(2), 259–264 (1982). [CrossRef]
I. D. Henning and J. V. Collins, “Measurements of the semiconductor laser linewidth broadening factor,” Electron. Lett.19(22), 927–929 (1983). [CrossRef]
Z. Toffano, A. Destrez, C. Birocheau, and L. Hassine, “New linewidth enhancement determination method in semiconductor lasers based on spectrum analysis above and below threshold,” Electron. Lett.28(1), 9–11 (1992). [CrossRef]
C. Harder, K. Vahala, and A. Yariv, “Measurement of the linewidth enhancement factor alpha of semiconductor lasers,” Appl. Phys. Lett.42(4), 328–330 (1983). [CrossRef]
F. Devaux, Y. Sorel, and J. K. Kerdiles, “Simple measurement of fiber dispersion and of chirp parameter of intensity modulated light emitter,” J. Lightwave Technol.11(12), 1937–1940 (1993). [CrossRef]
M. Osinski, D. F. G. Gallagher, and I. H. White, “Measurement of linewidth broadening factor in gain-switched InGaAsP injection lasers by CHP method,” Electron. Lett.21(21), 981–982 (1985). [CrossRef]
J. Jeong and Y. K. Park, “Accurate determination of transient chirp parameter in high speed digital lightwave transmitters,” Electron. Lett.33(7), 605–606 (1997). [CrossRef]
P. Lazaridis, G. Debarge, and P. Gallion, “Time-bandwidth product of chirped sech(2) pulses: application to phase-amplitude-coupling factor measurement,” Opt. Lett.20(10), 1160–1162 (1995). [CrossRef] [PubMed]
R. Hui, A. Mecozzi, A. D'Ottavi, and P. Spano, “Novel measurement technique of alpha factor in DFB semiconductor lasers by injection locking,” Electron. Lett.26(14), 997–998 (1990). [CrossRef]
Y. Yu, G. Giuliani, and S. Donati, “Measurement of the linewidth enhancement factor of semiconductor lasers based on the optical feedback self-mixing effect,” IEEE Photon. Technol. Lett.16(4), 990–992 (2004). [CrossRef]
M. Osinski and J. Buus, “Linewidth broadening factor in semiconductor lasers - an overview,” IEEE J. Quantum Electron.23(1), 9–29 (1987). [CrossRef]
T. Fordell and A. M. Lindberg, “Experiments on the linewidth-enhancement factor of a Vertical-Cavity Surface-Emitting Laser,” IEEE J. Quantum Electron.43(1), 6–15 (2007). [CrossRef]
T. Fordell and A. M. Lindberg, “Noise correlation, regenerative amplification, and the linewidth enhancement factor of a Vertical-Cavity Surface-Emitting Laser,” IEEE Photon. Technol. Lett.20(9), 667–669 (2008). [CrossRef]
K. Y. Lau, “Gain switching of semiconductor injection lasers,” Appl. Phys. Lett.52(4), 257–259 (1988). [CrossRef]
F. Li, Y. Park, and J. Azaña, “Complete temporal pulse characterization based on phase reconstruction using optical ultrafast differentiation (PROUD),” Opt. Lett.32(22), 3364–3366 (2007). [CrossRef] [PubMed]
A. Consoli, J. M. Tijero, and I. Esquivias, “Time resolved chirp measurements of gain switched semiconductor laser using a polarization based optical differentiator,” Opt. Express19(11), 10805–10812 (2011). [CrossRef] [PubMed]
R. Tucker, “High-speed modulation of semiconductor lasers,” J. Lightwave Technol.3(6), 1180–1192 (1985). [CrossRef]
L. A. Coldren and S. W. Corzine, Diode Lasers and Photonic Integrated Circuits (John Wiley & Sons, Inc., 1995).
A. Consoli, I. Esquivias, F. J. L. Hernandez, J. Mulet, and S. Balle, “Characterization of gain-switched pulses from 1.55-µm VCSEL,” IEEE Photon. Technol. Lett.22(11), 772–774 (2010). [CrossRef]
F. Li, Y. Park, and J. Azaña, “Linear characterization of optical pulses with durations ranging from the picosecond to the nanosecond regime using ultrafast photonic differentiation,” J. Lightwave Technol.27(21), 4623–4633 (2009). [CrossRef]

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[1] C. H. Henry, “Theory of the linewidth of semiconductor lasers,” IEEE J. Quantum Electron.18(2), 259–264 (1982). [CrossRef]

[2] I. D. Henning and J. V. Collins, “Measurements of the semiconductor laser linewidth broadening factor,” Electron. Lett.19(22), 927–929 (1983). [CrossRef]

[3] Z. Toffano, A. Destrez, C. Birocheau, and L. Hassine, “New linewidth enhancement determination method in semiconductor lasers based on spectrum analysis above and below threshold,” Electron. Lett.28(1), 9–11 (1992). [CrossRef]

[4] C. Harder, K. Vahala, and A. Yariv, “Measurement of the linewidth enhancement factor alpha of semiconductor lasers,” Appl. Phys. Lett.42(4), 328–330 (1983). [CrossRef]

[5] F. Devaux, Y. Sorel, and J. K. Kerdiles, “Simple measurement of fiber dispersion and of chirp parameter of intensity modulated light emitter,” J. Lightwave Technol.11(12), 1937–1940 (1993). [CrossRef]

[6] M. Osinski, D. F. G. Gallagher, and I. H. White, “Measurement of linewidth broadening factor in gain-switched InGaAsP injection lasers by CHP method,” Electron. Lett.21(21), 981–982 (1985). [CrossRef]

[7] J. Jeong and Y. K. Park, “Accurate determination of transient chirp parameter in high speed digital lightwave transmitters,” Electron. Lett.33(7), 605–606 (1997). [CrossRef]

[8] P. Lazaridis, G. Debarge, and P. Gallion, “Time-bandwidth product of chirped sech(2) pulses: application to phase-amplitude-coupling factor measurement,” Opt. Lett.20(10), 1160–1162 (1995). [CrossRef] [PubMed]

[9] R. Hui, A. Mecozzi, A. D'Ottavi, and P. Spano, “Novel measurement technique of alpha factor in DFB semiconductor lasers by injection locking,” Electron. Lett.26(14), 997–998 (1990). [CrossRef]

[10] Y. Yu, G. Giuliani, and S. Donati, “Measurement of the linewidth enhancement factor of semiconductor lasers based on the optical feedback self-mixing effect,” IEEE Photon. Technol. Lett.16(4), 990–992 (2004). [CrossRef]

[11] M. Osinski and J. Buus, “Linewidth broadening factor in semiconductor lasers - an overview,” IEEE J. Quantum Electron.23(1), 9–29 (1987). [CrossRef]

[12] T. Fordell and A. M. Lindberg, “Experiments on the linewidth-enhancement factor of a Vertical-Cavity Surface-Emitting Laser,” IEEE J. Quantum Electron.43(1), 6–15 (2007). [CrossRef]

[13] T. Fordell and A. M. Lindberg, “Noise correlation, regenerative amplification, and the linewidth enhancement factor of a Vertical-Cavity Surface-Emitting Laser,” IEEE Photon. Technol. Lett.20(9), 667–669 (2008). [CrossRef]

[14] K. Y. Lau, “Gain switching of semiconductor injection lasers,” Appl. Phys. Lett.52(4), 257–259 (1988). [CrossRef]

[15] F. Li, Y. Park, and J. Azaña, “Complete temporal pulse characterization based on phase reconstruction using optical ultrafast differentiation (PROUD),” Opt. Lett.32(22), 3364–3366 (2007). [CrossRef] [PubMed]

[16] A. Consoli, J. M. Tijero, and I. Esquivias, “Time resolved chirp measurements of gain switched semiconductor laser using a polarization based optical differentiator,” Opt. Express19(11), 10805–10812 (2011). [CrossRef] [PubMed]

[17] R. Tucker, “High-speed modulation of semiconductor lasers,” J. Lightwave Technol.3(6), 1180–1192 (1985). [CrossRef]

[18] L. A. Coldren and S. W. Corzine, Diode Lasers and Photonic Integrated Circuits (John Wiley & Sons, Inc., 1995).

[19] A. Consoli, I. Esquivias, F. J. L. Hernandez, J. Mulet, and S. Balle, “Characterization of gain-switched pulses from 1.55-µm VCSEL,” IEEE Photon. Technol. Lett.22(11), 772–774 (2010). [CrossRef]

[20] F. Li, Y. Park, and J. Azaña, “Linear characterization of optical pulses with durations ranging from the picosecond to the nanosecond regime using ultrafast photonic differentiation,” J. Lightwave Technol.27(21), 4623–4633 (2009). [CrossRef]

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Self-validating technique for the measurement of the linewidth enhancement factor in semiconductor lasers