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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 20, Iss. 5 — Feb. 27, 2012
  • pp: 4979–4987

Self-validating technique for the measurement of the linewidth enhancement factor in semiconductor lasers

Antonio Consoli, Borja Bonilla, Jose Manuel G. Tijero, and Ignacio Esquivias  »View Author Affiliations


Optics Express, Vol. 20, Issue 5, pp. 4979-4987 (2012)
http://dx.doi.org/10.1364/OE.20.004979


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Abstract

A new method for measuring the linewidth enhancement factor (α-parameter) of semiconductor lasers is proposed and discussed. The method itself provides an estimation of the measurement error, thus self-validating the entire procedure. The α-parameter is obtained from the temporal profile and the instantaneous frequency (chirp) of the pulses generated by gain switching. The time resolved chirp is measured with a polarization based optical differentiator. The accuracy of the obtained values of the α-parameter is estimated from the comparison between the directly measured pulse spectrum and the spectrum reconstructed from the chirp and the temporal profile of the pulse. The method is applied to a VCSEL and to a DFB laser emitting around 1550 nm at different temperatures, obtaining a measurement error lower than ± 8%.

© 2012 OSA

OCIS Codes
(060.4510) Fiber optics and optical communications : Optical communications
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(140.5960) Lasers and laser optics : Semiconductor lasers
(250.7260) Optoelectronics : Vertical cavity surface emitting lasers
(140.3538) Lasers and laser optics : Lasers, pulsed

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: January 11, 2012
Revised Manuscript: February 2, 2012
Manuscript Accepted: February 7, 2012
Published: February 13, 2012

Citation
Antonio Consoli, Borja Bonilla, Jose Manuel G. Tijero, and Ignacio Esquivias, "Self-validating technique for the measurement of the linewidth enhancement factor in semiconductor lasers," Opt. Express 20, 4979-4987 (2012)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-20-5-4979


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