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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 20, Iss. 5 — Feb. 27, 2012
  • pp: 5419–5428

Generalized ellipsometry in-situ quantification of organic adsorbate attachment within slanted columnar thin films

Keith B. Rodenhausen, Daniel Schmidt, Tadas Kasputis, Angela K. Pannier, Eva Schubert, and Mathias Schubert  »View Author Affiliations

Optics Express, Vol. 20, Issue 5, pp. 5419-5428 (2012)

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We apply generalized ellipsometry, well-known to be sensitive to the optical properties of anisotropic materials, to determine the amount of fibronectin protein that adsorbs onto a Ti slanted columnar thin film from solution. We find that the anisotropic optical properties of the thin film change upon organic adsorption. An optical model for ellipsometry data analysis incorporates an anisotropic Bruggeman effective medium approximation. We find that differences in experimental data from before and after fibronectin adsorption can be solely attributable to the uptake of fibronectin within the slanted columnar thin film. Simultaneous, in-situ generalized ellipsometry and quartz crystal microbalance measurements show excellent agreement on the amount and rate of fibronectin adsorption. Quantitative characterization of organic materials within three-dimensional, optically anisotropic slanted columnar thin films could permit their use in optical sensor applications.

© 2012 OSA

OCIS Codes
(240.2130) Optics at surfaces : Ellipsometry and polarimetry

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: December 22, 2011
Revised Manuscript: February 10, 2012
Manuscript Accepted: February 13, 2012
Published: February 21, 2012

Keith B. Rodenhausen, Daniel Schmidt, Tadas Kasputis, Angela K. Pannier, Eva Schubert, and Mathias Schubert, "Generalized ellipsometry in-situ quantification of organic adsorbate attachment within slanted columnar thin films," Opt. Express 20, 5419-5428 (2012)

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