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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 20, Iss. 5 — Feb. 27, 2012
  • pp: 5658–5682

Absolute distance measurement with micrometer accuracy using a Michelson interferometer and the iterative synthetic wavelength principle

Khaled Alzahrani, David Burton, Francis Lilley, Munther Gdeisat, Frederic Bezombes, and Mohammad Qudeisat  »View Author Affiliations


Optics Express, Vol. 20, Issue 5, pp. 5658-5682 (2012)
http://dx.doi.org/10.1364/OE.20.005658


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Abstract

We present a novel system that can measure absolute distances of up to 300 mm with an uncertainty of the order of one micrometer, within a timeframe of 40 seconds. The proposed system uses a Michelson interferometer, a tunable laser, a wavelength meter and a computer for analysis. The principle of synthetic wave creation is used in a novel way in that the system employs an initial low precision estimate of the distance, obtained using a triangulation, or time-of-flight, laser system, or similar, and then iterates through a sequence of progressively smaller synthetic wavelengths until it reaches micrometer uncertainties in the determination of the distance. A further novel feature of the system is its use of Fourier transform phase analysis techniques to achieve sub-wavelength accuracy. This method has the major advantages of being relatively simple to realize, offering demonstrated high relative precisions better than 5 × 10−5. Finally, the fact that this device does not require a continuous line-of-sight to the target as is the case with other configurations offers significant advantages.

© 2012 OSA

OCIS Codes
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: November 14, 2011
Revised Manuscript: January 13, 2012
Manuscript Accepted: February 10, 2012
Published: February 23, 2012

Citation
Khaled Alzahrani, David Burton, Francis Lilley, Munther Gdeisat, Frederic Bezombes, and Mohammad Qudeisat, "Absolute distance measurement with micrometer accuracy using a Michelson interferometer and the iterative synthetic wavelength principle," Opt. Express 20, 5658-5682 (2012)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-20-5-5658


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